• Xilinx Corporation XC2S30-5VQG100I (1713/1741)-18.5% Failure Rate -pieces failed with no output or program error
  • Central Semiconductor Corp CCLHM100TR(Date and Lot Code removed) -100% Failure Rate – Found 10 pieces failed with low IP
  • STMicroelectronics STR912FAZ46H6(Date and Lot Code removed)-8% Failure Rate – 16 pieces failed with program error or ID-check error
  • Crtstal CS5516-AP (0614/0623)-7% Failure Rate -1 piece failed with broken protective diodes
  • Murata GRM21BR71A106KE51L (20181224)-100% Failure Rate -Found all failed with low Capacitance-MLCC
  • Bourns Inc CD143A-SR05 (1846) -100% Failure Rate -Found 20 pieces failed with both pin 2,pin 3 open to and pin 4
  • Alpha & Omega Semiconductor AO4407A (18E) -100% Failure Rate -Found 10 pieces failed with high Rds(on) and low Vgs(th)- Active discrete
  • Freescale Semiconductor, Inc MC68EC030FE25C (0328/1148) -50.5% Failure Rate -pieces failed with short pins and broken protective diodes
  • Alpha & Omega Semiconductor AO4805 (18B) -100% Failure Rate – Found all failed with high Rds(on) and low Vgs(th)
  • Avago Technologies HSMS-2828-TR1G (Date and Lot Code removed)-7% Failure Rate -4 pieces test sample failed with high IR
  • Cypress Semiconductor CY7C1021BN-12VXI (1235) -20% Failure Rate – piece failed with pin checking error
  • Murata GRM31CR71C106KA12L (20181103)-100% Failure Rate -Found all failed with high DF-MLCC
  • Avx 08051C474K4Z2A (1833)-10% Failure Rate -Removed 5 pieces to test the Insulation Resistance for 2 minutes with 100V rated voltage, which should be more than 2.12GΩ. Found all failed-MLCC
  • Stm STW26NM50(Date and Lot Code removed)-39% Failure Rate -38 pieces failed with low Vgs(th) and 1 piece failed with short circuit.
  • Te Connectivity IM06TS(1722) -100% Failure Rate – Found all failed with high Coil Resistance.
  • Epcos B43510B5687M (Date and Lot Code removed)-20% Failure Rate -1 piece failed with high DF
  • Taiyo Yuden EMK105ABJ474KVHF (1808)-63.5% Failure Rate – 77 pieces failed with – high Capacitance.
  • Cypress Semiconductor CY22381FI(Date and Lot Code removed)-86% Failure Rate – 796 pieces failed with program error and 89 pieces failed with no output frequency
  • Ixys IXTM24N50 (1523)-11% Failure Rate – 6 pieces failed with high Rds(on),3 pieces failed with high Igss,2 pieces failed with low BVdss.
  • Tdk Semiconductor Corporation C0603X5R1A474M030BC (1752)-6% Failure Rate – 6 pieces failed with low capacitance-MLCC
  • Vicor VE-2T1-CW (Date and Lot Code removed)-10% Failure Rate -4 pieces failed with low output wherein 2 pieces had 12V normal output when the load changed to 16
  • Tdk Semiconductor Corporation ACM4520-231-2P-T000 (1746)-100% Failure Rate – Found 50 pieces failed that the Impedance was within 684.21Ω to 1764.28Ω, and the DC resistance was less than 50mΩ-MLCC
  • Nxp semiconductors SC26C92C1N (723)-100% Failure Rate -Found that 100 pieces failed testing with short pins and broken protective diodes
  • Toko 614AN-9391Z=P3(18+)-100% Failure Rate -Found all failed with the Low Inductance
  • Fairchild RHRP15120 (Date and Lot Code removed)-7.5% Failure Rate – 3 pieces failed(1A73AR 2PCS;1H75AK 1PC) with high IR
  • Texas Instruments ISO122JPE4(Date and Lot Code removed)-5% Failure Rate -Found 700 pieces passed that the gain was about 1, but 37 pieces failed.
  • Altera EP3C40F780C8N(1649)-97% Failure Rate -pieces failed with program error or no output.
  • Altera EPF10K20RI208-4N (Date and Lot Code removed)-6% Failure Rate -pieces failed with no output
  • Xilinx Corporation XC2S30-5VQG100I (1713/1741)-6% Failure Rate -22 pieces failed with no output
  • Avx 12106D107KAT2A (1840)-100% Failure Rate -Found all failed with Low Capacitance-MLCC
  • ST Microelectronics STM8S105K4U6A(1733/1734) -100% Failure Rate -Found that 4 pieces failed testing with no response.
  • AMD AM29F800BT-90EC(1011) -100% Failure Rate – Found that 400 pieces failed testing with ID-check error
  • Tdk Semiconductor Corporation CGA2B2X7R1C224M050BA (1843)-100% Failure Rate -DF at room temperature-MLCC
  • Toshiba 2SK2992 (Date and Lot Code removed)-100% Failure Rate -Idss is high and Vgs(on) and BVdss are low
  • Murata GRM2165C1H222GA01D (20181125) -6% Failure Rate -pieces failed with high capacitance-MLCC
  • Cypress Semiconductor FM25V05-GTR (1713) -8% Failure Rate – pieces failed with ID-check error
  • Stm STW26NM50(Date and Lot Code removed)-39% Failure Rate – 38 pieces failed with low Vgs(th) and 1 piece failed with short circuit.
  • Laird Technologies MI0603L221R-10 (1824)-100% Failure Rate -Found all failed with high DCR
  • Samsung CL32B225KCJZW6E(Date and Lot Code removed)-8% Failure Rate -high capacitance- MLCC
  • Murata GRM155Z71A225KE01D (2018) -100% Failure Rate -low capacitance-MLCC
  • Murata GRM1555C1H560GA01D (20170725) -78% Failure Rate -22 pieces samples failed low capacitacne,17 pcs high capacitance-MLCC
  • Lumileds LXML-PB01-0030(1309) -75% Failure Rate -LOW LUMINIOUS FLUX
  • Samsung CL32B106KBJNNWE(Date and Lot Code removed)-100% Failure Rate -capacitacne change was more than 15% at 125°-MLCC
  • Murata GRM32EC80J107ME20L(20180719) -100% Failure Rate -capacitacne change was more than 22% at 105°-MLCC
  • Stmicroelectronics BTB41-600BRG(Date and Lot Code removed)-100% Failure Rate -high VT
  • Rohm RF201L2STE25 (Date and Lot Code removed)-98% Failure Rate -VF is too high to pass
  • Toshiba TPH1500CNH,L1Q(M (1451)-8% Failure Rate -pieces failed with high Idss
  • Toshiba TPH1500CNH,L1Q(M (1450)-6% Failure Rate -pieces failed with high Idss
  • Toshiba TPH1500CNH,L1Q(M (1452)-6% Failure Rate -pieces failed with high Idss
  • Toshiba TPH1500CNH,L1Q(M (1451)-6% Failure Rate -pieces failed with high Idss
  • Murata GRM188Z71A475KE15D(Date and Lot Code removed)-58.5% Failure Rate – pieces failed with low capacitance-MLCC
  • Yageo CC0402KRX7R5BB474 (Date and Lot Code removed)-40% Failure Rate – pieces failed with Low Capacitance-MLCC
  • Maxim Integrated MAX15301AA01(526)-100% Failure Rate – pieces Failed testing that can not be found device on PMBus
  • Texas instruments ADS1262IPWR(Date and Lot Code removed)-14% Failure Rate -20 pieces failed with 2.490-2.493V of VREF Output Voltage, 15 pieces failed with 0V of VREF Output Voltage
  • Murata GRM188C80J106KA73D(Date and Lot Code removed)-10% Failure Rate – Found all failed that the capacitance change was more than 22% at 105℃-MLCC
  • Analog Devices AD521SD/883B (18+) -8% Failure Rate -Found 795 pieces passed with correct signal and gain, but 69 pieces failed.
  • Winbond W25Q40CLSNIG (1643) -100% Failure Rate -Found that unit failed testing with blank-check error that can not be erased
  • Vicor VE-2T1-CW(Date and Lot Code removed)-10% Failure Rate – pieces failed with low output wherein 2 pieces had 12V normal output when the load changed to 16
  • Samsung CL32B106KBJNNNE(Date and Lot Code removed)-27.5% Failure Rate – high capacitance-MLCC
  • Amd AU1100-333MBD(1319;1325;1337;1341) -17% Failure Rate -failed with short pins and broken protective diodes
  • Samsung CL05B474KQ5NNNC(Date and Lot Code removed)-38.5% Failure Rate – high capacitance-MLCC
  • Stmicroelectronics BTB41-600BRG (Date and Lot Code removed)-100% Failure Rate – high VT

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