Substandard Parts List

White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods.

While this list does not imply that the balance of devices within a lot are defective and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 3 Substandard Parts List

Analog AD521SD/883B (Date Code not marked or labeled) – 8% Failure Rate - output distortion.

Analog Devices, Inc. AD5381BSTZ-5 (Date Code 1442) - 7% Failure Rate - wrong analog output at 38 and 39.

Xilinx Corporation XC3S1400A-4FTG256C (Date Code 1641) - 18% Failure Rate - program error or no output.

ST Microelectronics BTB16-800SWRG (Date Code not marked or labeled) – 100% Failure Rate - the Igt was more than 10mA.

Motorola MC68040RC25A (Date Code unknown) - 50% Failure Rate - open pins.

 



微信截图_20170117174137111026
 Xilinx Corporation XC3S1400A-4FTG256C (Date Code 1641) – 18% Failure Rate - program error or no output.

 

2017 Running Weekly Quality Chart

QQ截图20170117182520
In Week 2, Inspectionyields rose sharply from 88% in Week 1 to 94%, while Electrical Testing yields dropped slightly from 76% to 74% in Week 2.94% ElectricalTesting Pass in Week 2 is higher than 80.40% average in 2016. While 74% Inspection Accept in Week 1 is lower than 83.58% average in 2016.

 

 

 

 

 

 

 

 

2017 Substandard Parts list

Analog AD521SD/883B (Date Code not marked or labeled) – 8% Failure Rate - output distortion.

Analog Devices, Inc. AD5381BSTZ-5 (Date Code 1442) – 7% Failure Rate - wrong analog output at 38 and 39.

Xilinx Corporation XC3S1400A-4FTG256C (Date Code 1641) – 18% Failure Rate - program error or no output.

ST Microelectronics BTB16-800SWRG (Date Code not marked or labeled) – 100% Failure Rate - the Igt was more than 10mA.

Motorola MC68040RC25A (Date Code unknown) - 50% Failure Rate - open pins.

AMD AM29F800BT-70EI (Date Code 0525) - 100Failure Rate -  ID check error.

Xilinx Corporation XC2S200E-6PQG208I (Date Code 1423) 5Failure Rate -program error or no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) - 26Failure Rate - high coil resistance and one or more pins failing to make contact.

Xilinx Corporation XQ4013E-4PG223M (Date Code 1131) 16Failure Rate -no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) 9Failure Rate -one or more non-switching contacts.

National Semiconductor LM108H (Date Code not marked or labeled) 21% Failure Rate - low output.

National Semiconductor LM108H (Date Code not marked or labeled) 10Failure Rate - low negative output.

 Renesas Electronics UPD70F3614M2GBA-GAH (Date Code not marked or labeled) - 84% Failure Rate - programmer communication error wherein the programmer cannot read the device ID.

Altera Corporation EP3C10F256CI7N (Date Codes 1609;1603;1609) – 9% Failure Rate- program error or no output.

Xilinx Corporation XQ4013E-4PG223M (Date Codes 1133 and 1143) - 53% Failure Rate - 不良品其无输出.

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) – 14% Failure Rate- 不良品其不良为无输出.

Xilinx Corporation XC7K325T-2FF676I (Multiple Date Code) – 12% Failure Rate- program error.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) – 28% Failure Rate - blank-check error(Can not be erased).

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) - 100Failure Rate - Pin F2 short-circuit to F9(F3 should short-circuit to F9 normally).

Texas instruments CC1020RSSR (Date Code unknown) – 100% Failure Rate - broken protective diodes.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) -28% Failure Rate - blank-check error(Can not be erased).

Skyworks AS179-92LF (Date Code not marked or labeled) - 13Failure Rate - 为开关无动作.

Texas instruments TMS320C25GBA (Date Code 1025) -76% Failure Rate - failed with open pins(L2).

Littelfuse 1.5SMC300A (Date Code not marked or labeled) - 19Failure Rate - high Ir.

ST Microelectronics L9162 (Date Code not marked or labeled) - 16%Failure Rate - no or wrong regulator outputs.

Freescale Semiconductor, Inc. MC68EC030FE40C (Date Code 0325) - 100%Failure Rate - short pins.

Philips BC879 (Date Code N/A) - 16Failure Rate - high Ices.

Vishay VQ1001P (Date Code N/A) - 63Failure Rate - low BVdss,high Rds(on),open-circuit and high leakage current.

Xilinx Corporation XC2C512-7FTG256C (Date Code 1541) - 6Failure Rate - broken protective diodes.

Analog Devices AD558SD (Date Codes 1611 and 1615) - 6Failure Rate - broken protective diodes.

Advanced Micro AM29DL323DB-90EI (Date Codes 0049,0044 and 0123) – 100% Failure Rate -  ID-check error.

Advanced Micro AM29F032B-90EC/(D) (Date Codes 0442 and 0535) – 10% Failure Rate - program error.

AMD AM29F800BT-70EC (Date Code 0525) - 100% Failure Rate - wrong ID code or poor contact pins.

Xilinx XC9536-10VQG44C (Date Code 1231) - 5Failure Rate -下载程序出错其版本为“0000”.

Altera EP20K1500EFC33-1X (Date Code 521) - 100Failure Rate - functional testing with no output.

Bourns SDR1305-101K (Date Code 1148) - 74Failure Rate - low Inductance(manufacturer specification is minimum of 90uH).

Freescale MC68HC705C8ACFNE (Date Code 1133) - 100% Failure Rate - blank-check error.

Microsemi APT66F60L (Date Code not marked or labeled) - 33% Failure Rate - short-circuits.

AVX  12065C224JAT2A (Date Code 1435 and 1502) - 37% Failure Rate - low capacitance.

Microsemi APT66F60L  (Date Code N/A) - 33% Failure Rate - short-circuits.

IXYS IXFK66N50Q2  (Date Code N/A) - 33% Failure Rate - short-circuits.

STMicroelectronics PSD854F2-90JI       (Date Code 723) - 100% Failure Rate - ID check error

Altera Corporation EP20K1500EFC33-1X     (Date Code 0521) - 50% Failure Rate - no output

Panasonic  ECK-TBC472MF   (Date Code N/A) - 42% Failure Rate - low Capacitance.

Atmel Corporation AT45DB642D-CNU        (Date Code 1324;1326;1306;1243) - 100% Failure Rate - 1024-Bytes Page size

NXP Semiconductors  74HC595D     (Date Code N/A) - 25% Failure Rate - the SHCP(pin11) short-circuit to GND

Mitsubishi  CM600DY-24A       (Date Code N/A) - 14% Failure Rate - low Vge(th).

Silicon Laboratories  CP2102-GM       (Date Code 1612) - 100% Failure Rate - 脚位保护二极管开路

Texas Instruments  TPS61040DBVR     (Date Code 1520;1523) - 50% Failure Rate - the used samples failed with low output that the internal switch didn’t work.

TDK  LTF5022T-100M1R3-D   (Date Code N/A) - 16% Failure Rate - 7 pieces failed with high Inductance and 1 piece failed with low Inductance.

Xilinx Corporation XC2S50-6TQG144C        (Date Code 1343) - 9% Failure Rate - program error or no output.

Murata  PRF18BE471QS5RB    (Date Code N/A) - 100% Failure Rate - the Resistance have no obvious change at 25°C, 80°C, 90°C, 93°C and 107°C.

EPCOS  B43693A2226Q007        (Date Code N/A) - 100% Failure Rate - high ESR and Impedance

Renesas Electronics  M3062LFGPFP#U3C      (Date Code N/A) - 60% Failure Rate - program error.

E-Switch  TL1015AF160QG   (Date Code N/A) - 50% Failure Rate - open contacts when the button is pressed

Xilinx Corporation  XC4VFX60-11FFG672C       (Date Code 1505) - 12% Failure Rate - program error.

Taiyo Yuden  UMK325C7106KM-T     (Date Code N/A) - 11% Failure Rate - 114 pieces failed with high DF, 3 pieces failed with low Capacitance and 1 piece failed with high Capacitance.

Xilinx Corporation  XC95288-15HQ208I    (Date Code 1017) - 50% Failure Rate - no output.

Xilinx Corporation  XQ4010E-4PG191M       (Date Code 1120) - 7% Failure Rate - no output.

Murata  HB01U05S05ZC     (Date Code N/A) - 100% Failure Rate - no output.

Microsemi  PIC601        (Date Code N/A) - 20% Failure Rate - 2 pieces failed with no output, 2 pieces failed with internal short-circuit and 2 pieces pins broken.

Xilinx Corporation  XC4VLX25-11FFG668I       (Date Code 1409) - 10% Failure Rate - no output.

Texas Instruments  TMS9995NL      (Date Code 9428) - 22% Failure Rate -  broken protective diodes

MIC  HER307     (Date Code N/A) - 6% Failure Rate - high Vf.

Sony  CXD1179Q        (Date Code Unknown) - 28% Failure Rate - open pins and broken protective diodes.

Xilinx Corporation  XC95288-15HQ208I      (Date Code 1017) - 10% Failure Rate - no output.

Texas Instruments  OPA2604AU     (Date Code N/A) - 66% Failure Rate -  low Vout.

Hittite  HMC234C8      (Date Code N/A) - 81% Failure Rate - no switching or distorted outputs.

Hittite  HMC403S8G     (Date Code N/A) - 84% Failure Rate - one output always high

Exar  XR68C681CP       (Date Code N/A) - 10% Failure Rate - short pins and broken protective diodes.

Texas instruments  TMS320F243PGEA     (Date Code N/A) - 6% Failure Rate - open and short pins.

MAXIM  MAX660ESA+      (Date Code N/A) - 6% Failure Rate - low Oscillator Frequency and 1 piece failed with -5.6V output.

MAXIM  MAX834EUK+T     (Date Code N/A) - 5% Failure Rate - 11 pieces failed that the Vout can’t be tripped, 10 pieces failed with no output and 1 piece failed that the Vout was tripped while the Vcc was 3.655V.

Omron  G3VM-41HR     (Date Code N/A) - 100% Failure Rate - the Ron was more than 20 with 2A load current at connection A.

Xilinx Corporation XC95288-15HQ208I    (Date Code 1013) - 100% Failure Rate - program error with Version”0000″

Gec Plessey SP8691A-DG     (Date Code N/A) - 100% Failure Rate - all parts failed at -55°C and 125°C with incorrect output frequency, wherein at cold temperature the output frequency is about 20MHz while at hot temperature it is about 16MHz with instability. At 25°C, all parts shows the correct output frequency.

ON Semiconductor MTP2P50E   (Date Code N/A) - 20% Failure Rate - high Idss

Analog Devices, Inc. AD8362ARUZ    (Date Code 1524) - 33% Failure Rate - 3 pieces with high gain (3.85V-4.86V), 4 pieces with no output, and 2 pieces with very low output (1V to 1.75V). 1 piece from unused samples failed with no output.

Analog Devices, Inc. AD5160BRJZ10    (Date Code N/A) - 100% Failure Rate - 3片为端点到端点的电阻大于500千欧,1片为70千欧,1片总是为5千欧其不能用不能用程序控制

Xilinx Corporation XC95288-15HQ208I    (Date Code 1027) - 100% Failure Rate - program error with Version”0000″

Xilinx Corporation XC4VSX35-10FFG668CS2   (Date Code 1409) - 25% Failure Rate - program error or no output.

Texas Instruments ADS7864Y250     (Date Code N/A) - 5% Failure Rate - readings of 0×800 at Full-scale (2.5V) or no data

ST Microelectronics PSD813F3-15J  (Date Code N/A) - 100% Failure Rate - ID error

Dallas Semiconductor DS1284QN   (Date Code 0818) - 100% Failure Rate - poor-contact-pin

Vishay  IRFP32N50KPBF    (Date Code N/A) - 22% Failure Rate - high Rds(on)

Xilinx Corporation XQ4005E-4PG156M    (Date Code 9817) - 100% Failure Rate - 都能装载bitstream配置芯片但是输出不正常

Xilinx Corporation XQ4010E-4PG191M      (Date Code 0541) - 100% Failure Rate - 1片不能装载比他stream配置芯片,1片为功能输出不良

Dallas Semiconductor DS1314S-2+  (Date Code N/A) - 25% Failure Rate - high /BW pin when Vbat is low and Vcc is above trip point.

Texas Instruments UCC2806DW   (Date Code N/A) - 36% Failure Rate - low Vref or no output switching

NXP Semiconductor  BTA316X-800B    (Date Code 1323; 1510;1408) - 51% Failure Rate - internal short-circuit

Xilinx Corporation XC9536-10VQG44C    (Date Code 1123) - 5% Failure Rate - program error or no output

Xilinx Corporation XC3SD3400A-4CSG484LI      (Date Code 1539;1541) - 10% Failure Rate - program  error  or no output

Maxim MAX8069CCZQ       (Date Code Unknown) - 99% Failure Rate - 78 pieces failed with Vf open and 21 pieces failed with high or low Vout.

Atmel Corporation AT45DB642D-CNU   (Date Code 1438) - 5% Failure Rate - program&verify error

PLX Technology, Inc. PCI9052G (Date Code Multiple date code) - 15% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q      (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 24% Failure Rate - program download error (53 pcs are ver.0) or no output

Samsung Electronics S3F441FXZZ-ETRF (Date Code 117) - 5% Failure Rate - open,short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 20% Failure Rate - program download error  or no output

Xilinx Corporation XC2V1000-5FG256I       (Date Code 1141;1109;1125) - 8% Failure Rate - program error or no output.

Zoran ZR36060PQCG29.5   (Date Code Unknown) - 24% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C      (Date Code 1123) - 5% Failure Rate - program error or no output.

Silicon Laboratories CP2102-GM    (Date Code 1546) - 33% Failure Rate - 脚位保护二极管开路.

Xilinx Corporation XC4VSX35-10FFG668CS2 (Date Code 1408) - 11% Failure Rate - no output.

Vishay JANTX2N6660    (Date Code N/A) - 6% Failure Rate - 2片漏电流偏高,22片内部开路,4片内部短路.

Silicon Laboratories CP2102-GM  (Date Code 1546) - 100% Failure Rate - 脚位保护二极管开路

Nais DS4-EM-DC48V-1C-N76    (Date Code N/A) - 9% Failure Rate - one or more contacts with high leakage

PANASONIC ECE-T1HA273FA    (Date Code 1408) - 11% Failure Rate - no output

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) – 26% Failure Rate - long duration or with wrong playback

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) - 19% Failure Rate - short/long duration or with wrong playback

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Information Storage Devices, Inc. ISD2560P    (Date Code 1137) - 19% Failure Rate - short/long duration or with wrong playback.

Intel MG87C196KD-16  (Date Code 9736/9728) - 88% Failure Rate - There’s program exist in initial memory.

Renesas Electronics 2SJ222    (Date Code N/A) - 100% Failure Rate - the BVdss was less than -100V with -10mA drain current

Xilinx Corporation XC17128EPD8C    (Date Code N/A) - 20% Failure Rate - blank-check error.

Xilinx Corporation XQ4005E-4PG156M   (Date Code 1137) - 17% Failure Rate - programming error or no output.

Cypress Semiconductor CY7C344-25WM  (Date Code  N/A) - 100% Failure Rate - ID-check error with CY7C344B program.

Vbsemi IRF7328   (Date Code  N/A) - 100% Failure Rate - the Rds(on) was more than 21m  with -8A drain current and more than 32m with -6.8A drain current.

Intel MG87C196KD-16  (Date Code 9736/9728) - 86% Failure Rate - There’s program exist in initial memory.

Mitsubishi QM100HC-M  (Date Code N/A) - 100% Failure Rate - the Vce(sat) was more than 2V with 100A collector current, the collector current can’t reach to 100A.

Xilinx Corporation XC95108-10PQG100C   (Date Code 1123/1137) - 7% Failure Rate - program error or no output.

Xilinx Corporation XC95108-10PQG100C   (Date Code 1123/1431/1137) - 14Failure Rate - program error or no output.

Burr-Brown Corporation ADS7844N/1K  (Date Code  N/A) - 7% Failure Rate - readings of 0×0 at Half-Scale(5V) or no data.

Xilinx Corporation XC9536-10VQG44C (Date Code 1137) - 6% Failure Rate - program error wherein 29 pieces with Version is “0000″.

Texas Instruments ADS5474IPFP (Date Code not marked or labeled) - 22% Failure Rate - broken protective diodes.

International Rectifier IRGS4062DPBF (Date Code not marked or labeled) - 100% Failure Rate - the Vce(on) was more than 1.95V with 24A drain current.

Panasonic Semiconductors EETED2E152EA (Date Code not marked or labeled) - 30% Failure Rate - the ESR was more than 50mΩ at 20kHz.

Texas Instruments LM4040AIM3-2.5/NOPB (Date Code not marked or labeled) - 90% Failure Rate - high Vr and 11 pieces failed with low Vr.

Infineon Technologies BTS410E2 E3043 (Date Code not marked or labeled) – 32% Failure Rate – no output switching.

Texas Instruments ADS5474IPFP (Date Code not marked or labeled) – 22% Failure Rate – broken protective diodes.

NEC UPD4464C12L (Date Code not marked or labeled) – 9% Failure Rate – failed with read or write data.

NXP Semiconductors TDA1557Q (Date Code not marked or labeled) – 5% Failure Rate - no output switching in two or more outputs.

Altera Corporation EP1S30F1020I6 (Date Code 1429) - 9% Failure Rate - Program error.

NXP Semiconductor NE5050N (Date Codes 0239 and 0205) - 69% Failure Rate - The pins are short and the protective diodes are broken.

Infineon Technologies BTS410E2 E3043 (Date Code 1428) - 28% Failure Rate - No output switching.

Intel EE80C186EB25 (Date Code not marked or labeled) - 10% Failure Rate - The pins (pin 3, 39 and 60) are open.

Xilinx Corporation XC9536-10VQG44C (Date Code 1137) - 7% Failure Rate - Program error.

ST Microelectronics STP80NF55-06 (Date Code 0428) - 100% Failure Rate - The Vgs(th) was less than 2V with 250uA drain current and the Vsd was more than 1.5V with 80A source-drain current.

Xilinx Corporation XC6VLX130T-2FFG1156C (Date Codes 1535 and 1537 ) - 9% Failure Rate - Parts with Date code 1537 failed with program error or no output.

Analog Devices DAC8840FS (Date Code 1246) - 6% Failure Rate - Output was 0V at Full-Scale(0xffH).

Xilinx Corporation XQ4010E-4PG191M (Date Codes 1120 and 1137 ) - 14% Failure Rate - Functional error with +4.75V supply.

ST Microelectronics STP80NF55-06 (Date Code 0428) - 100% Failure Rate - The Vsd was more than 1.5V with 80A source-drain current.

Burr-Brown Corporation ADS7844N/1K (Date Code not marked or labeled) - 20% Failure Rate - The reading was 0V at Full-scale(5V) or no data.

Intersil ICM7170AIBG (Date Code not marked or labeled) - 6% Failure Rate - No output frequency on OSC_OUT(Pin9).

Altera Corporation EP2C35F484C6N (Date Code not marked or labeled) - 7% Failure Rate - Program error or no output.

Xilinx Corporation XC9572-10TQG100C (Date Code 1251) - 12% Failure Rate - Program error or no output.

Xilinx Corporation XC6SLX150T-3FGG484I (Date Code 1505) - 58% Failure Rate - Program error or no output.

 

Fairchild Semiconductor KA1M0680RB-YDTU (Date code not marked or labeled) - 28% Failure Rate - No output switching.

Ibek 24IPS3-05-S (Date code not marked or labeled) - 5% Failure Rate - Low output.

Fujitsu 7MBR30NE060 (Date code 0506) - 26% Failure Rate - High Ices or high Iges of Inverter IGBT, or high Irrm of Brake diode.

Fujitsu 7MBR30NE060 (Date code 0506) - 30% Failure Rate - High Ices or high Iges of Inverter IGBT, or high Irrm of Brake diode.

Burr-Brown Corporation ADS7844N/1K (Date code not marked or labeled) - 29% Failure Rate - No Digital data.

Burr-Brown Corporation ADS7844N/1K (Date code not marked or labeled) - 43% Failure Rate - No Digital data, and some pieces with pent pins.

 

Cypress Semiconductor CY7C144-55AC (Date Code 1328) - 26% Failure Rate - Wrong write data value.

IXYS Semiconductor IXFX38N80Q2 (Date Code not marked or labeled) - 100% Failure Rate - Low Gfs, or high Rds(on)and high leakage current or low Vgs(th).

Fujitsu 7MBR30NE060 (Date Code 0506) - 26% Failure Rate - High Ices or high Iges of Inverter IGBT, or high Irrm of Brake diode.

Xilinx Corporation XC9572-10TQG100C (Date Code 1249) - 38% Failure Rate - Program error.

Freescale Semiconductor, Inc. MC68EC030FE25C (Date Code 9525) - 9% Failure Rate - Shorted pins.

Intel EE87C196KC20 (Date Code not marked or labeled) - 100% Failure Rate - Blank-check error.

Micron Technology N25Q128A13BSE40F (Date Code not marked or labeled) - 10% Failure Rate - Program or ID error.

Cypress Semiconductor CY7C144-55AC (Date Code 1328) - 43% Failure Rate - Cannot write data.

Infineon Technologies SFH6943-3T (Date Code not marked or labeled) - 73% Failure Rate - Low BVceo or low CTR.

NXP Semiconductors TDA1557Q (Date Code not marked or labeled) - 6% Failure Rate - Wrong output state or no output switching.

Analog Devices DAC8840FS (Date Code 1220) – 18% Failure Rate - Failed with reading of 4.4V at Full-Scale (0xFFH) and -2.5V at Zero-output(0x80H).

Xilinx XC95216-20PQ160I (Date Code 1145) – 15% Failure Rate - Functional errors.

Xilinx XC4VSX55-11FF1148C (Date Code 1429) – 8% Failure Rate - Program error that the VCCIO short to GND.

AOS AOZ1021AI (Date Code not marked or labeled) - 100% Failure Rate - The input current was increasing and damaged the parts.

Intel EE80C186EB25 (Date Code not marked or labeled) - 17% Failure Rate - Short pins and broken protective diode.

Altera Corporation EP1C20F324C8N  (Date Code 1525) - 6% Failure Rate - Program error or no output and with missing ball.

Altera Corporation XC95216-20PQ160I  (Date Code 1145) - 15% Failure Rate - Functional errors.

Xilinx Corporation XC6VLX130T-2FFG1156C (Date Codes 1521 and 1525 ) - 6% Failure Rate - Program error.

Intersil X28HC256DI-12 (Date Code 0832) - 28% Failure Rate - Program and Verify error.

Vishay SI7956DP-T1-GE3  (Date Code not marked or labeled) - 55% Failure Rate - Open-circuit and Short circuit.

Fujitsu 2MBI300N-060  (Date Code not marked or labeled) - 100% Failure Rate - The Vce(sat) was more than 2.8V with 100A collector current and the Vf was more than 3V with 100A forward current.

Integrated Circuit System MK1413STR (Date Code not marked or labeled) - 30% Failure Rate - No output due to supply and input clamping.

Texas Instruments OPA561PWP  (Date Code A613 and A42C and AE2C) - 100% Failure Rate - The Vout was more than +/-6.5V with 12Ω load at room temperature -40°C and 100°C, but no output repeatedly even though there was no load at 125°C.

Maxim MAX1644EAE  (Date Code not marked or labeled) - 100% Failure Rate - The Vout can’t be regulated to 3.333V when the Vin was less than 4.5V.

AVX TAJB226K016RNJ  (Date Code 1545) - 6% Failure Rate - Low Capacitance and high DF or ESR.

Analog Devices ADUM5401ARWZ  (Date Code 1410) - 100% Failure Rate - When Vdd1=5V at either levels of Vsel, Viso=0V. Generally, when Viso is supplied by 5V, the channel outputs function is at Vsel=5V and will be inactive when Vsel=GND.

Spansion S29GL128M10FAIR20  (Date Code not marked or labeled) - 100% Failure Rate - Wrong ID code.

Texas Instruments SN65HVD3082EDR (Date Code not marked or labeled) - 100% Failure Rate - No receiver output with driver outputs due to shorts on GND, VCC and A Bus.

AUO UPS161 (Date Code 0930) - 30% Failure Rate - Shorted pins.

AUO UPS161 (Date Code 0930) - 15% Failure Rate - Open pins.

Xicor X28HC256DI-12 (Date Code 0543 and 0530) - 51% Failure Rate - Program & verify error.

Analog Devices AD7510DIKN (Date Code not marked or labeled) - 6% Failure Rate - Failed Id(off) with leakage above 1uA and Ron with non-matched channels.

Texas instruments MSP430F1471IPMR (Date Code not marked or labeled) - 100% Failure Rate - Pin1(DVcc) short to Pin63(DVss), and the resistance is about 95Ohms between Pin57 and 62.

Advanced Micro Devices AM79C874VI (Date Code 0228) - 100% Failure Rate - Pin 76, 77 and 78 are short.

International Rectifier IRF9310TRPBF  (Date Code not marked or labeled) - 100% Failure Rate - High Rds(on) which is about 19mΩ with -16A drain current and 13mΩ with -20A drain current.

Texas instruments TMS320F243PGEA (Date Code not marked or labeled) - 34% Failure Rate - Short pins.

Spansion S29GL128M10FAIR20  (Date Code not marked or labeled) - 100% Failure Rate - Wrong ID code.

Agilent Technologies HCNW3120   (Date Code not marked or labeled) - 46% Failure Rate - Input diode open and no output.

Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.
2. “Accept” is defined as customer acceptance of report device condition.
3. “Pass” is defined as meeting electrical parameters defined by the agreed upon test plan.