Substandard Parts List

White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods.

While this list does not imply that the balance of devices within a lot is defective and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 38 Substandard Parts List

  • Murata GRM21BR71A106KE51L (Lot code WG76205CC L035, Date code 20170627 (2617)) – 6% Failure Rate - high Capacitance.
  • Kemet C0603C472J1GACTU (Date Code 1727) – 100% Failure Rate - DF was more than 0.1%.
  • Nxp Semiconductor PMEG2005AEA (Date Code 1725)  - 100% Failure Rate - high Vf.

QQ截图20170930162017

    • Kemet C0603C472J1GACTU (Date Code 1727) - 100% Failure Rate - DF was more than 0.1%.

2017 Running Weekly Quality Chart

week 38

In Week 38, In Week 38, Inspection yields maintained the same 84% value as Week 37, while Electrical Testing yields rased from Week 37′s 61% to 88%

Test yields are getting battered by active and passive discretes that fail to meet manufacturer specifications and are probably counterfeits during the current shortage.

 

 

 

 

 

2017 Substandard Parts list

Murata GRM21BR71A106KE51L (Lot code WG76205CC L035, Date code 20170627 (2617)) - 6% Failure Rate - high Capacitance.

Kemet C0603C472J1GACTU (Date Code 1727) - 100% Failure Rate - DF was more than 0.1%.

Nxp Semiconductor PMEG2005AEA (Date Code 1725)  - 100% Failure Rate - high Vf.

Murata GCM32EC71H106MA03L (Date Code 1646, Lot # IA6N06PLF L115) - 6% Failure Rate - High DF (dissipation factor).

Kemet T495D107K010ATA100 (Date Code 1708) - 13% Failure Rate - High and Low Capacitance and high ESR.

SEMIKRON SKM400GB12V (Date Code 0607)  - 100% Failure Rate - High Vce(sat) and Vf meaning they are not 90A devices.

Freescale Semiconductor DSP56301AG80 (Date Code 1337) - 12% Failure Rate - Incorrect pin-outs.

Xilinx Corporation XC2VP70-5FFG1517C (Date Code Multiple date code and no marking)- 13% Failure Rate – 34 piece failed with open pin, and 1 piece failed with no output.

Microsemi JAN2N4858 (Date Code no marked or labeled) -19% Failure Rate - 13 pieces failed with high Igss, 4 pieces failed with high Idss and 2 pieces failed with open-circuit.

Murata LQM31PN3R3M00L (Date Code no marked or labeled)  -15% Failure Rate - low DC Resistance.

Xilinx Corporation XC2S50-6PQG208C (Date Code 1621) -8.% Failure Rate - program error or no output(Some of failed parts are the dimension of part not match the socket ).

Kemet T494D107M016AT (Date Code no marked or labeled) -50% Failure Rate - high leakage current.

Freescale Semiconductor DSP56301AG100(Date Code 1308) -14% Failure Rate - open pin 28(BCLK).

Maxim Integrated DS1553-100 (Date Code 1607) -87.64% Failure Rate - Nonvolatile functionality.

Vishay 592D228X96R3X2T20H (Date Code no marked or labeled) -10% Failure Rate – low Capacitance.

Xilinx Corporation XC2S50-6PQG208C (Date Code 1621,1637) -5.51% Failure Rate - with program error or no output(Some of failed parts are the dimension of part not match the socket ).

GRM21BR71E335KA73L GRM21BR71E335KA73L (Date Code no markerd or labeled) -100% Failure Rate-Capacitance was more than 3.63uF.

Maxim Integrated DS1553-100 (Date Code 1403)- 54.17% Failure Rate - 4 pieces failed with program error,22 pieces failed with very the Nonvolatile functionality.
AVX 22201C106MAT2A (Date Code not marked or labeled)- 11.25% Failure Rate - with high Capacitance Change at 125°C.
Murata GRM31CC80J476ME18L (Date Code not marked or labeled) – 6.25% Failure Rate - low Capacitance.
Sharp LH28F320S5HNS-L90 (Date Code 0540) – 16.22% Failure Rate - with blank-check error(can not be erased) or poor contact pins.
ST Microelectronics STP5NK52ZD (Date Code not marked or labeled)- 21% Failure Rate - 10 pieces failed with high Rds(on), 9 pieces failed with high Idss and 2 pieces failed with short-circuit.
SEMIKRON SKM400GB12V (Date Code N/A)-100% Failure Rate - the Vce(sat) was more than 2.2V with 90A collector current and the Vf was more than 2.52V with 90A forward current.

Cypress Semiconductor  CY7C53120E4-40SXI  (Date Codes 1436)- 11% Failure Rate - failed with ID-check error. 
Micron Technology Inc  MT29F16G08ABABAWP-ITB (Date Codes 1405)  -100% Failure Rate- failed testing with ID-check error.
Panasonic ERJ-1TNF36R0U (Date Codes unknown)-23.75% Failure Ratefailed with high Resistance Temperature Coefficient at -55°C.
National Semiconductor LM112H/883B (Date Codes N/A)-18% Failure Rate- waveform distortion.
 Microchip Technology Inc  MRF49XA-I /ST (Date Code 1545) - 10% Failure Rate -whit broke protective diodes

Xilinx Corporation XC3S400A-4FTG256C (Date Codes 1701:;1705 )-6.03% Failure Rate- with program error or no output.

Nxp Semiconductor  BUK9875-100A  (Date Code not marked or labeled)-100% Failure Rate- with high Rds(on).

GPS  SL486DP  (Date Code not marked or labeled)-20% Failure Rate- with short pins and broken protective diodes.

Freescale Semiconductor DSP56301AG100  (Date Code 1308) - 14% Failure Rate - Open pin 28 (BCLK).

Maxim DS1267-100 (Date Code 1449,1443) – 100% Failure Rate - testing open/short, protective diodes and resistance of High.

Littelfuse 1.5SMC220CA  (Date Code N/A) - 71% Failure Rate - low Vbr (breakdown voltage).

Xilinx  XC2VP70-5FFG1517C  (Date Code unknown) - 45% Failure Rate – Program error or poor contact pin.

Realtek Semiconductor RTL8326-VC-LF (Date Code 8326) - 55% Failure Rate - broken protective diodes.

Xilinx Corporation  XQ4013E-4PG223M (Date Code 1201) – 20% Failure Rate - Can not load bitstream.

Analog Devices AD704ARZ-16 (Date Code 1614,1631)18.04% Failure Rate

Samsung  S3C2410A20-Y080 (Date Code 1328) - 6.0% Failure Rate - Short pins and broken protective diodes.

Siemens  TDA4718B (Date Codes 0821;0849) - 13.9% Failure Rate- with broken protective diodes.

Murata GCM188R71H103JA15D  (Date Code unknown) - 15% Failure Rate – with low Capacitance

AVX  TLJY687M006R0100 (Date Code N/A) - 17% Failure Rate -capacitance with readings lower than 544uF. 5 pieces failed DCL with leakage current within 45uA to 75uA

Maxim DS1267-100 (Date Code 1449;1443) - 100% Failure Rate-open-short, protective diodes and resistance of High

Motorola UAA1016B (Date Code 9352) - 100% Failure Rate -inconsistent pin-outs

Datel  TWR-5/1000-12/210-D24A-C(Date Code 9352)  - 100% Failure Rate -load current

Yageo  CC0805ZKY5V6BB106  (Date Code unknow) -15.63% Failure Rate -Insulation Resistance fail failed with breakdown.

Cypress Semiconductor  CY7B933-JC (Date Codes 1641) - 5.33Failure Rate - 4pcs (D/C-1641) open issues.

Kinston  KE4CN2H5A (Date Code 1424;1336) - 27% Failure Rate -can not beprogramm

TDK C2012C0G2W222KT000N(Date Code N/A) - 100Failure Rate -Found all failed that the Q was less than 1000.

Xilinx Corporation  XCS40XL-4PQ208I (Date Code 1533 - 5.13Failure Rate- failed with program error or no output.

Altera 5AGXMA5G4F31I5N (Date Code 1427) - 37.5% Failure Rate - Program error.

Texas instruments TLC2543IDBR (Date Code Unknown) - 10Failure Rate - digital code 0×477 at 2.5V analog input.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 7Failure Rate - 27 pieces failed wherein 11 pieces failed with high coil resistance, 3 pieces failed with open coil, 3 pieces failed with low coil resistance and 10 pieces failed with one or more non-switching contacts.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 7Failure Rate - 27 pieces failed wherein 11 pieces failed with high coil resistance, 3 pieces failed with open coil, 3 pieces failed with low coil resistance and 10 pieces failed with one or more non-switching contacts.

Xilinx Corporation XQ4013E-4PG223M (Date Code 1143) - 20Failure Rate - VCC and GND short circuit.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 6Failure Rate - 11 pieces failed wherein 5 pieces failed with low coil resistance and 6 pieces failed with one or more pins contacting at open state.

Tyco TVB140NSA (Date Code N/A) - 100Failure Rate - Idm was more than 100uA while the Vdm was 15V. The Vdm was less than 15V.

Cypress CY27EE16ZEC-ES (Date Code 0309) - 5Failure Rate - 29 pieces failed with different EEPROM scratchpad addresses wherein 18 pieces cannot be programmed, 10 pieces with configurable clock outputs, and 1 piece with wrong frequency at start-up.

Xilinx Corporation XC7K480T-2FFG1156I (Date Code 1413) - 100% Failure Rate VCCIO, VCCINT and GND short circuit.

Xilinx Corporation XC2V1000-4FG456I  (Date Codes 1425 and 1419) - 5% Failure Rate - program error or no output.

Altera Corporation EPF10K100EQI208-2 (Date Code 1545) - 6Failure Rate - program error or no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) - 7Failure Rate - one or more non-switching contacts.

Altera Corporation EPF10K200SRC240-1X (Date Code 1149) - 5Failure Rate - no output.

Fairchild Semiconductor 740L6011 (Date Code not marked or labeled) - 17Failure Rate - no output switch.

Xilinx XC1701SO20I (Date Code unknown) – 100% Failure Rate - blanck-check error.

Omnivision Technologies, Inc OV9655-VL1A (Date Code unknown) – 16% Failure Rate - no image.

Fairchild Semiconductor MM74C923N (Date Code not marked or labeled) – 100% Failure Rate - wrong key-code.

Analog AD521SD/883B (Date Code not marked or labeled) – 8% Failure Rate - output distortion.

Analog Devices, Inc. AD5381BSTZ-5 (Date Code 1442) – 7% Failure Rate - wrong analog output at 38 and 39.

Xilinx Corporation XC3S1400A-4FTG256C (Date Code 1641) – 18% Failure Rate - program error or no output.

ST Microelectronics BTB16-800SWRG (Date Code not marked or labeled) – 100% Failure Rate - the Igt was more than 10mA.

Motorola MC68040RC25A (Date Code unknown) - 50% Failure Rate - open pins.

AMD AM29F800BT-70EI (Date Code 0525) - 100Failure Rate -  ID check error.

Xilinx Corporation XC2S200E-6PQG208I (Date Code 1423) 5Failure Rate -program error or no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) - 26Failure Rate - high coil resistance and one or more pins failing to make contact.

Xilinx Corporation XQ4013E-4PG223M (Date Code 1131) 16Failure Rate -no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) 9Failure Rate -one or more non-switching contacts.

National Semiconductor LM108H (Date Code not marked or labeled) 21% Failure Rate - low output.

National Semiconductor LM108H (Date Code not marked or labeled) 10Failure Rate - low negative output.

 Renesas Electronics UPD70F3614M2GBA-GAH (Date Code not marked or labeled) - 84% Failure Rate - programmer communication error wherein the programmer cannot read the device ID.

Altera Corporation EP3C10F256CI7N (Date Codes 1609;1603;1609) – 9% Failure Rate- program error or no output.

Xilinx Corporation XQ4013E-4PG223M (Date Codes 1133 and 1143) - 53% Failure Rate - 不良品其无输出.

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) – 14% Failure Rate- 不良品其不良为无输出.

Xilinx Corporation XC7K325T-2FF676I (Multiple Date Code) – 12% Failure Rate- program error.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) – 28% Failure Rate - blank-check error(Can not be erased).

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) - 100Failure Rate - Pin F2 short-circuit to F9(F3 should short-circuit to F9 normally).

Texas instruments CC1020RSSR (Date Code unknown) – 100% Failure Rate - broken protective diodes.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) -28% Failure Rate - blank-check error(Can not be erased).

Skyworks AS179-92LF (Date Code not marked or labeled) - 13Failure Rate - 为开关无动作.

Texas instruments TMS320C25GBA (Date Code 1025) -76% Failure Rate - failed with open pins(L2).

Littelfuse 1.5SMC300A (Date Code not marked or labeled) - 19Failure Rate - high Ir.

ST Microelectronics L9162 (Date Code not marked or labeled) - 16%Failure Rate - no or wrong regulator outputs.

Freescale Semiconductor, Inc. MC68EC030FE40C (Date Code 0325) - 100%Failure Rate - short pins.

Philips BC879 (Date Code N/A) - 16Failure Rate - high Ices.

Vishay VQ1001P (Date Code N/A) - 63Failure Rate - low BVdss,high Rds(on),open-circuit and high leakage current.

Xilinx Corporation XC2C512-7FTG256C (Date Code 1541) - 6Failure Rate - broken protective diodes.

Analog Devices AD558SD (Date Codes 1611 and 1615) - 6Failure Rate - broken protective diodes.

Advanced Micro AM29DL323DB-90EI (Date Codes 0049,0044 and 0123) – 100% Failure Rate -  ID-check error.

Advanced Micro AM29F032B-90EC/(D) (Date Codes 0442 and 0535) – 10% Failure Rate - program error.

AMD AM29F800BT-70EC (Date Code 0525) - 100% Failure Rate - wrong ID code or poor contact pins.

Xilinx XC9536-10VQG44C (Date Code 1231) - 5Failure Rate -下载程序出错其版本为“0000”.

Altera EP20K1500EFC33-1X (Date Code 521) - 100Failure Rate - functional testing with no output.

Bourns SDR1305-101K (Date Code 1148) - 74Failure Rate - low Inductance(manufacturer specification is minimum of 90uH).

Freescale MC68HC705C8ACFNE (Date Code 1133) - 100% Failure Rate - blank-check error.

Microsemi APT66F60L (Date Code not marked or labeled) - 33% Failure Rate - short-circuits.

AVX  12065C224JAT2A (Date Code 1435 and 1502) - 37% Failure Rate - low capacitance.

Microsemi APT66F60L  (Date Code N/A) - 33% Failure Rate - short-circuits.

IXYS IXFK66N50Q2  (Date Code N/A) - 33% Failure Rate - short-circuits.

STMicroelectronics PSD854F2-90JI       (Date Code 723) - 100% Failure Rate - ID check error

Altera Corporation EP20K1500EFC33-1X     (Date Code 0521) - 50% Failure Rate - no output

Panasonic  ECK-TBC472MF   (Date Code N/A) - 42% Failure Rate - low Capacitance.

Atmel Corporation AT45DB642D-CNU        (Date Code 1324;1326;1306;1243) - 100% Failure Rate - 1024-Bytes Page size

NXP Semiconductors  74HC595D     (Date Code N/A) - 25% Failure Rate - the SHCP(pin11) short-circuit to GND

Mitsubishi  CM600DY-24A       (Date Code N/A) - 14% Failure Rate - low Vge(th).

Silicon Laboratories  CP2102-GM       (Date Code 1612) - 100% Failure Rate - 脚位保护二极管开路

Texas Instruments  TPS61040DBVR     (Date Code 1520;1523) - 50% Failure Rate - the used samples failed with low output that the internal switch didn’t work.

TDK  LTF5022T-100M1R3-D   (Date Code N/A) - 16% Failure Rate - 7 pieces failed with high Inductance and 1 piece failed with low Inductance.

Xilinx Corporation XC2S50-6TQG144C        (Date Code 1343) - 9% Failure Rate - program error or no output.

Murata  PRF18BE471QS5RB    (Date Code N/A) - 100% Failure Rate - the Resistance have no obvious change at 25°C, 80°C, 90°C, 93°C and 107°C.

EPCOS  B43693A2226Q007        (Date Code N/A) - 100% Failure Rate - high ESR and Impedance

Renesas Electronics  M3062LFGPFP#U3C      (Date Code N/A) - 60% Failure Rate - program error.

E-Switch  TL1015AF160QG   (Date Code N/A) - 50% Failure Rate - open contacts when the button is pressed

Xilinx Corporation  XC4VFX60-11FFG672C       (Date Code 1505) - 12% Failure Rate - program error.

Taiyo Yuden  UMK325C7106KM-T     (Date Code N/A) - 11% Failure Rate - 114 pieces failed with high DF, 3 pieces failed with low Capacitance and 1 piece failed with high Capacitance.

Xilinx Corporation  XC95288-15HQ208I    (Date Code 1017) - 50% Failure Rate - no output.

Xilinx Corporation  XQ4010E-4PG191M       (Date Code 1120) - 7% Failure Rate - no output.

Murata  HB01U05S05ZC     (Date Code N/A) - 100% Failure Rate - no output.

Microsemi  PIC601        (Date Code N/A) - 20% Failure Rate - 2 pieces failed with no output, 2 pieces failed with internal short-circuit and 2 pieces pins broken.

Xilinx Corporation  XC4VLX25-11FFG668I       (Date Code 1409) - 10% Failure Rate - no output.

Texas Instruments  TMS9995NL      (Date Code 9428) - 22% Failure Rate -  broken protective diodes

MIC  HER307     (Date Code N/A) - 6% Failure Rate - high Vf.

Sony  CXD1179Q        (Date Code Unknown) - 28% Failure Rate - open pins and broken protective diodes.

Xilinx Corporation  XC95288-15HQ208I      (Date Code 1017) - 10% Failure Rate - no output.

Texas Instruments  OPA2604AU     (Date Code N/A) - 66% Failure Rate -  low Vout.

Hittite  HMC234C8      (Date Code N/A) - 81% Failure Rate - no switching or distorted outputs.

Hittite  HMC403S8G     (Date Code N/A) - 84% Failure Rate - one output always high

Exar  XR68C681CP       (Date Code N/A) - 10% Failure Rate - short pins and broken protective diodes.

Texas instruments  TMS320F243PGEA     (Date Code N/A) - 6% Failure Rate - open and short pins.

MAXIM  MAX660ESA+      (Date Code N/A) - 6% Failure Rate - low Oscillator Frequency and 1 piece failed with -5.6V output.

MAXIM  MAX834EUK+T     (Date Code N/A) - 5% Failure Rate - 11 pieces failed that the Vout can’t be tripped, 10 pieces failed with no output and 1 piece failed that the Vout was tripped while the Vcc was 3.655V.

Omron  G3VM-41HR     (Date Code N/A) - 100% Failure Rate - the Ron was more than 20 with 2A load current at connection A.

Xilinx Corporation XC95288-15HQ208I    (Date Code 1013) - 100% Failure Rate - program error with Version”0000″

Gec Plessey SP8691A-DG     (Date Code N/A) - 100% Failure Rate - all parts failed at -55°C and 125°C with incorrect output frequency, wherein at cold temperature the output frequency is about 20MHz while at hot temperature it is about 16MHz with instability. At 25°C, all parts shows the correct output frequency.

ON Semiconductor MTP2P50E   (Date Code N/A) - 20% Failure Rate - high Idss

Analog Devices, Inc. AD8362ARUZ    (Date Code 1524) - 33% Failure Rate - 3 pieces with high gain (3.85V-4.86V), 4 pieces with no output, and 2 pieces with very low output (1V to 1.75V). 1 piece from unused samples failed with no output.

Analog Devices, Inc. AD5160BRJZ10    (Date Code N/A) - 100% Failure Rate - 3片为端点到端点的电阻大于500千欧,1片为70千欧,1片总是为5千欧其不能用不能用程序控制

Xilinx Corporation XC95288-15HQ208I    (Date Code 1027) - 100% Failure Rate - program error with Version”0000″

Xilinx Corporation XC4VSX35-10FFG668CS2   (Date Code 1409) - 25% Failure Rate - program error or no output.

Texas Instruments ADS7864Y250     (Date Code N/A) - 5% Failure Rate - readings of 0×800 at Full-scale (2.5V) or no data

ST Microelectronics PSD813F3-15J  (Date Code N/A) - 100% Failure Rate - ID error

Dallas Semiconductor DS1284QN   (Date Code 0818) - 100% Failure Rate - poor-contact-pin

Vishay  IRFP32N50KPBF    (Date Code N/A) - 22% Failure Rate - high Rds(on)

Xilinx Corporation XQ4005E-4PG156M    (Date Code 9817) - 100% Failure Rate - 都能装载bitstream配置芯片但是输出不正常

Xilinx Corporation XQ4010E-4PG191M      (Date Code 0541) - 100% Failure Rate - 1片不能装载比他stream配置芯片,1片为功能输出不良

Dallas Semiconductor DS1314S-2+  (Date Code N/A) - 25% Failure Rate - high /BW pin when Vbat is low and Vcc is above trip point.

Texas Instruments UCC2806DW   (Date Code N/A) - 36% Failure Rate - low Vref or no output switching

NXP Semiconductor  BTA316X-800B    (Date Code 1323; 1510;1408) - 51% Failure Rate - internal short-circuit

Xilinx Corporation XC9536-10VQG44C    (Date Code 1123) - 5% Failure Rate - program error or no output

Xilinx Corporation XC3SD3400A-4CSG484LI      (Date Code 1539;1541) - 10% Failure Rate - program  error  or no output

Maxim MAX8069CCZQ       (Date Code Unknown) - 99% Failure Rate - 78 pieces failed with Vf open and 21 pieces failed with high or low Vout.

Atmel Corporation AT45DB642D-CNU   (Date Code 1438) - 5% Failure Rate - program&verify error

PLX Technology, Inc. PCI9052G (Date Code Multiple date code) - 15% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q      (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 24% Failure Rate - program download error (53 pcs are ver.0) or no output

Samsung Electronics S3F441FXZZ-ETRF (Date Code 117) - 5% Failure Rate - open,short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 20% Failure Rate - program download error  or no output

Xilinx Corporation XC2V1000-5FG256I       (Date Code 1141;1109;1125) - 8% Failure Rate - program error or no output.

Zoran ZR36060PQCG29.5   (Date Code Unknown) - 24% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C      (Date Code 1123) - 5% Failure Rate - program error or no output.

Silicon Laboratories CP2102-GM    (Date Code 1546) - 33% Failure Rate - 脚位保护二极管开路.

Xilinx Corporation XC4VSX35-10FFG668CS2 (Date Code 1408) - 11% Failure Rate - no output.

Vishay JANTX2N6660    (Date Code N/A) - 6% Failure Rate - 2片漏电流偏高,22片内部开路,4片内部短路.

Silicon Laboratories CP2102-GM  (Date Code 1546) - 100% Failure Rate - 脚位保护二极管开路

Nais DS4-EM-DC48V-1C-N76    (Date Code N/A) - 9% Failure Rate - one or more contacts with high leakage

PANASONIC ECE-T1HA273FA    (Date Code 1408) - 11% Failure Rate - no output

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) – 26% Failure Rate - long duration or with wrong playback

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) - 19% Failure Rate - short/long duration or with wrong playback

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Information Storage Devices, Inc. ISD2560P    (Date Code 1137) - 19% Failure Rate - short/long duration or with wrong playback.

Intel MG87C196KD-16  (Date Code 9736/9728) - 88% Failure Rate - There’s program exist in initial memory.

Renesas Electronics 2SJ222    (Date Code N/A) - 100% Failure Rate - the BVdss was less than -100V with -10mA drain current

Xilinx Corporation XC17128EPD8C    (Date Code N/A) - 20% Failure Rate - blank-check error.

Xilinx Corporation XQ4005E-4PG156M   (Date Code 1137) - 17% Failure Rate - programming error or no output.

Cypress Semiconductor CY7C344-25WM  (Date Code  N/A) - 100