Substandard Parts List

White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods.

While this list does not imply that the balance of devices within a lot is defective and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 22 Substandard Parts List

Kemet C1210C107M9PACTU (Batch Code 181223044) - 14% Failure Rate – Low capacitance.

NXP BSP130,115 (Date Code 0033) – 100% Failure Rate – High RDS(on).
Xilinx XC7K325T-1FBG676I (Date Code 1637) – 6% Failure Rate – No output.
Analog Devices AD7868BRZ (Date Code 1326) – 100% Failure Rate – Analog output from digital input consistent with AD7869, not AD7868.
Cypress CY7C9689A-AXC (pictured, Date Codes 1621 and 1725) – 10% Failure Rate – Broken protection diodes and shorted pins.
NXP BSP130,115 (Lot Code W G4) – 100% Failure Rate – Low V(br)DSS.
Murata GRM31CR60J476ME19L (Lot Code removed) - 13% Failure Rate – Low capacitance.
Murata GRM188R60J226MEA0D (Date Code labeled 1701+) – 50% Failure Rate – Capacitance change was more than 15% at 85C.
Murata GRM32ER71H106KA12L (Lot Code SC7O02CN9 L115) – 35% Failure Rate – Capacitance change was more than 15% at 125C.
Intel PC28F128P33BF60D (Date Codes 044, 047, and 635) – 8% Failure Rate – Program error.
TDK CGA4J3X7S1A106K125AB (Multiple date codes including 1748) – 100% Failure Rate – Low capacitance and low DF.
127715.1127715.2

                                                         

 2018 Running Weekly Quality Chart

  WEEK22
Those ancestors did their work! After seeing declining yields in both testing and inspection, something sparked a rally in Week 14. I’ll give credit to ancestors voicing their displeasure during Tomb Sweeping visitations.
Electrical Testing yields apparently got a little tired after three straight weeks of climbing. Yield dropped back to 74% in Week 22 after creeping up for three weeks and peaking at 78% in Week 21. Inspection yields held steady in Week 22, matching Week 21′s 86%.

 

2018 Substandard Parts list

Kemet C1210C107M9PACTU (Batch Code 181223044) – 14% Failure Rate – Low capacitance.

NXP BSP130,115 (Date Code 0033) – 100% Failure Rate – High RDS(on).
Xilinx XC7K325T-1FBG676I (Date Code 1637) – 6% Failure Rate – No output.
Analog Devices AD7868BRZ (Date Code 1326) – 100% Failure Rate – Analog output from digital input consistent with AD7869, not AD7868.
Cypress CY7C9689A-AXC (pictured, Date Codes 1621 and 1725) – 10% Failure Rate – Broken protection diodes and shorted pins.
NXP BSP130,115 (Lot Code W G4) – 100% Failure Rate – Low V(br)DSS.
Murata GRM31CR60J476ME19L (Lot Code removed) - 13% Failure Rate – Low capacitance.
Murata GRM188R60J226MEA0D (Date Code labeled 1701+) – 50% Failure Rate – Capacitance change was more than 15% at 85C.
Murata GRM32ER71H106KA12L (Lot Code SC7O02CN9 L115) – 35% Failure Rate – Capacitance change was more than 15% at 125C.
Intel PC28F128P33BF60D (Date Codes 044, 047, and 635) – 8% Failure Rate – Program error.
TDK CGA4J3X7S1A106K125AB (Multiple date codes including 1748) – 100% Failure Rate – Low capacitance and low DF.
Murata GRM32ER61A107ME20L (Date Code labeled 17) – 71% Failure Rate – Low capacitance.
Taiyo Yuden EMK212BJ106KG-T (Date Code 2017) – 13% Failure Rate – Capacitance change was more than 15% at 85C.
AVX 1206YC106KAT2A (Date Code IA6928M64 L115, 20161008) – 100% Failure Rate – Capacitance change was more than 15% at 125C.
Cypress CY7C9689A-AXC (pictured, Date Code 1621) – 8% Failure Rate – Bad protection diodes and shorted pins.
IXYS IXTH80N65X2 (Date Code 1623) – 100% Failure Rate – High RDS(on) and high VSD.
Rohm RB160M-30 (Date Code 1623) – 100% Failure Rate – High Vf @IF=1.0A.
Emerson LQD25A48-5V0-3V3REJ (Date Code xx) – 58% Failure Rate – Mixed bag of no output on both channels, output dropping to zero after starting out okay, no output at Vout2 with 5 ohm load, and one piece couldn’t even be tested.
National Semiconductor LM4130AIM5-2.5 (Date Code 16+) – 25% Failure Rate – Another mixed bag of tricks with some having low Vout and others having high Vout.
Infineon IPB60R165CP (Date Code 1526) – 99.95% (because that one piece would have been insulted) Failure Rate – High IDSS, high IGSS, open-circuits, low BVDSS, and high RDS(on)
Altera EP2AGX260FF3513N (Multiple date codes) – 6% Failure Rate – Program error and no output.
Fairchild FDS3682 (Date Code xx) – 50% Failure Rate – Low VGS(th).
National Semiconductor LM4130AIM5-2.5 (Date Code labeled 16+) – 25% Failure Rate – Low and high Vout. Mixed bag, but not a treat.

Littlefuse 0494004.NRHF (Lot Code 7A23F6215933) – 100% Failure Rate – Low output on the bright side, no output whatsoever on the dark side.
Murata GRM32ER7YA106K12L (pictured, Lot Code IA6928M64 L115, 20161008) – 12% Failure Rate – Capacitance change was more than 15% at 125C, and 1pc shorted out.
NXP A8943SF/N1 (Date Code 1033) – 8% Failure Rate – Low and no output.
Texas Instruments TPS79801QDGNRQ1 (Date Code not marked or labeled) – 100% Failure Rate – Failed go/no-go testing.
Maxim DS1821C (Lot Codes 1621 and 0123) – 100% Failure Rate – Failed go/no-go testing.
National Semiconductor DM9374N (Date Code 0015) – 100% Failure Rate – No output response.
Vishay JANTX2N6661 (Date Code 1120) – 39% Failure Rate - Opens, high Idss and high Rds(on).
Infineon BSS308PEH6327 (Date Code 1738) - 100% Failure Rate – Low V(BR)DSS, low VGS(th), and high RDS(on).
Altera EPM9320ARI208-10N (pictured, Date Code 0823) – 84% Failure Rate – Program error with VCC shorted to GND and cannot be programmed with “Device version is not enabled”. One guy just bailed and avoided testing with poor pin contacts.
Murata GRM155R70J105KA12D (Lot Code IA7N26RL8 PT263, 20171227) - 100% Failure Rate – Low capacitance.
TDK C1005X7S1A474K050BC (Date Code 1742) – 10% Failure Rate – Capacitance change was more than 22% at 125C..
Murata GRM21BR60J476ME15L (Lot Code not marked or labeled) – 100% Failure Rate – Capacitance change was more than 15% at 85C.
Vishay NTCS0603E3333JHT (Date Code 1746) - 100% Failure Rate – Low resistance.
NXP BFG135 (Date Code 1013) – 100% Failure Rate – Shorted after testing 100mA collector current, could not withstand specified load.
Murata GRM188R60J226MEA0D (Package Date 20170719, Lot Code removed) – 6% Failure Rate – Low capacitance.
Taiyo Yuden UMK325ABJ106MMHT (Date Code 1711, Lot Code 196215296717J16121S) - 6% Failure Rate – Capacitance change was more than 15% at -55C.
Nichicon EGPA500ELL681ML20S (Lot Code 70916-650254-07) - 6% Failure Rate – High capacitance.
Kemet C1206C226M8RACTU (Batch Code 181021759- 17% Failure Rate – Capacitance change was more than 15% at 125C.
NXP TDA8943SF/N1 (Date Code 1033) – 8% Failure Rate – On the bright side, it was just low output. Not much of a bright side. The other side was no output at all.
Xilinx XC2VP70-6FFG1517C (Date Codes 1105, 1113, 1117, and 1125) – 9% Failure Rate – No output.
International Rectifier IRLML9303TRPBF (Date Code 1423) - 34% Failure Rate – High Rds(on) and open circuits.
Kemet C1812C104F5GAC7800 (Date Code 082317KSC) - 100% Failure Rate – High dissipation factor (DF).
Murata GRM31CR71C106KA12L (Lot Code IA7N27WI1 L073, 20171201) - 100% Failure Rate – High dissipation factor (DF).
Fairchild HGTG12N60A4 (Lot Code 1H26AB) – 15% Failure Rate – Low BVCES and high IGES.
Murata GRM32DF51H106ZA01L (Lot Code not marked or labeled) - 5% Failure Rate – Low capacitance.
Murata GCR21BR71A106KE22L (Date Code IA7012BV0 L014, 20171021) - 6% Failure Rate – Low capacitance.
Murata GCM31CR70J226KE23L (Lot Code IA7N20FK1 L073, 20171124) - 5% Failure Rate – Low capacitance.
STMicroelectronics ST10F168Q6 (pictured, Date Code 0604) – 21% Failure Rate – Program error, ID-check error, and poor pin contacts.
STMicroelectronics ST10F168SQ6 (Date Code 0745) – 14% Failure Rate – Program error, ID-check error, and poor pin contacts.
TDK CGA4J3X7S1A106K125AB (Lot Code S7L232716) - 20% Failure Rate – Capacitance change was more than 22% at 125C.
Cree C4D10120E (Lot Code 16+) – 100% Failure Rate – High forward voltage, Vf.
NXP PMEG6030EP,115 (Date Codes 1738, 1802, and 1804) – 100% Failure Rate – High Vf (forward voltage) and high Ir (reverse current).

Philips SC26C92C1N (Date Code 0232) – 100% Failure Rate – Short pins and broken protection diodes.
Murata GRM31CR71C106KA12L (Lot Code 237302) – 100% Failure Rate – Capacitance change more than 15% at 125C.
Exar SP505ACM-L (Date Code 1120) – 100% Failure Rate – Broken protection diodes.
Murata GRM32ER71H106KA12L (Lot Code 20170211, IA7207 JW5 L115 – 13% Failure Rate – High dissipation factor (DF).
Micron MT29F1G08ABADAWP-ITD (Date Code 1624) - 40% Failure Rate – ID-check error.
Intel PC28F128P33BF60D (Date Codes 1047 and 1609) – 18% Failure Rate – Program error.
STMicroelectronics STH240N75F3-6 (Date Code 632) – 100% Failure Rate – High Idss, high Rds(on), and low V(br)dss.
Murata GRM21BR60J476ME15L (Lot Code FF8110608) – 100% Failure Rate – The capacitance change was more than 15% at 85C.
Taiyo Yuden JMK212BJ476MG-T (Date Code 1802) – 15% Failure Rate – Low capacitance and the capacitance change was more than 15% at 85C.
Renesas uPD78P0308GC-8EU-A (Date Codes 0131 and 0133) – 100% Failure Rate – Blank-check error.
Samsung CL10A106MO8NQNC (Date Code not marked or labeled) – 13% Failure Rate – High DF and shorted during leakage current testing.
Texas Instruments SN65C3232EDR (Lot Code 62C3232E) - 100% Failure Rate – Low driver output voltage.
Murata GRM155R61A105KE15D (Lot Code 23667) – 100% Failure Rate – The capacitance change was more than 15% at 85C.
Altera EPM9320ARI208-10N ( pictured, Date Code 0823) – 57% Failure Rate – Program error and VCC short to GND.
Vishay VJ1206Y224JXBAT (Lot Code 201745337) – 100% Failure Rate – High capacitance.
Altera EPM9320ARI208-10N ( pictured, Date Code 0823) – 19% Failure Rate – Program errors and no output.

Murata GRM155R60J105KE19D (Lot Code 601700) - 100% Failure Rate – High dissipation factor (DF).
Altera 5AGXFB7K4F40I3NAB (multiple Date Codes including 1349) – 7% Failure Rate – Program error and no output.
TDK CGA4J3X5R1H225K125AB (Lot Code S7D7153) - 100% Failure Rate – High dissipation factor (DF).
Xilinx XC7Z100-FFG900C (multiple Date Codes including 1537) - 5% Failure Rate – Program error.
Altera 5AGXFB7K4F0I3NAB (multiple Date Codes including 1529) – 6% Failure Rate – Program errors and no output.
AVX 1206GA560JAT2A (Date Code 1728, Lot Code K19-55667) – 8% Failure Rate – High capacitance.
Toshiba TLP504A-2(GB,F) (Date Codes 13, 251, 341, and 1142) - 58% Failure Rate – High VCEO, low CTR, high VSAT, high Vf, and high ICEO. Failures mixed by date code.
Fairchild S3M (Date Code 1622) – 57% Failure Rate – High Vf.
Taiyo Yuden EMK316AB7106KLHT (Date Code 1712) – 21% Failure Rate – Low capacitance.
Nanya NT5CB64MBFNNNE (Date Codes 1403, 1408, and 1420) - 9% Failure Rate – Open and short pins.
Xilinx XC2V70-5FF1517C (pictured, Date Codes 1105, 1113, 1117, and 1125) – 9% Failure Rate – No output, open pins, and short pins.
Samsung CL21A105MBFNNNE (Date Code not marked or labeled) - 24% Failure Rate – High capacitance.
Xilinx XC7Z100-FFG900C (multiple Date Codes including 1537) - 5% Failure Rate – Program error.
Altera 5AGXFB7K4F0I3NAB (multiple Date Codes including 1529) – 6% Failure Rate – Program errors and no output.
AVX 1206GA560JAT2A (Date Code 1728, Lot Code K19-55667) – 8% Failure Rate – High capacitance.
Toshiba TLP504A-2(GB,F) (Date Codes 13, 251, 341, and 1142) - 58% Failure Rate – High VCEO, low CTR, high VSAT, high Vf, and high ICEO. Failures mixed by date code.
Fairchild S3M (Date Code 1622) – 57% Failure Rate – High Vf.
Taiyo Yuden EMK316AB7106KLHT (Date Code 1712) - 21% Failure Rate – Low capacitance.
Nanya NT5CB64MBFNNNE (Date Codes 1403, 1408, and 1420) – 9% Failure Rate – Open and short pins.
Xilinx XC2V70-5FF1517C (pictured, Date Codes 1105, 1113, 1117, and 1125) - 9% Failure Rate – No output, open pins, and short pins.
Samsung CL21A105MBFNNNE (Date Code not marked or labeled) – 24% Failure Rate – High capacitance.

NXP PTVS30VP1UP (Date Code 1738) – 44 % Failure Rate – High Vbr and high Ir.

Analog Devices AD8674ARZ-REEL7 (Date Code 1744) – 100% Failure Rate – No ouput.
Xilinx XC7K325T-2FF676I (pictured, multiple Date Codes including 1401) – 59% Failure Rate – Program error.
Infineon IPD053N06NATMA1 (Date Code 1718) – 100% Failure Rate – High Rds(on) and low BVdss.
TDK C1005X5R0J106MT (Date Code not marked or labeled) - 22% Failure Rate – .
Power Integrations TOP242YN (Date Code 1734) – 14% Failure Rate – No switching.
Semikron 403GB128D (Date Code 06295) - 14% Failure Rate – High Ices and open circuit.
Murata GRM155R70J105KA12D (Date Code not marked or labeled) – 10% Failure Rate – Low capacitance.
AMS TSL2584TSV (Date Code 1609) – 100% Failure Rate – Wrong ID.
Murata GRM1885C1H103JA01D (Date Code 20170126, Lot Code IA7119M20 D015) – 100% Failure Rate – Low Q.
STMicroelectronics SD1487 (Date Code 9624) – 50% Failure Rate – Low breakdown voltage.
Exar/Sipex SP505ACM-L (pictured, Date Code 1120) – 100% Failure Rate – Broken protection diodes.
Altera EP2AGX260FF35I3N (multiple Date Codes including 1325) – 7% Failure Rate – Program error and no output.
Xilinx XXC7K325T-11FFG900C (multiple Date Codes including 1213) – 6% Failure Rate – Program error.
Vishay DG419LDY (Date Code 1647) – 100% Failure Rate – Output does not switch with different inputs.
TDK C3225X7R1H106M250AC (Date Code 1718) – 13% Failure Rate – Capacitance change was more than 15% at 125C (manufacturer tolerance is 15% at high temp).
Rubycon 16PK4700MEFC125X25 (Lot Code 3M1729) – 24% Failure Rate – The impedance Ratio was more than 8 at -40C.

Vishay SI2392DS-T1-GE3 (Date Code W1738W) - 100% Failure Rate – High Rds(on).

 Analog Devices ADV7511WBSWZ (pictured, Date Code 1536) – 10% Failure Rate – Short pins and broken protection diodes.
Diodes DFLT27A-7 (Date/Lot Code 1712-C673121.D1) – 26% Failure Rate – High reverse current, Ir.
Murata GRM31CR61C106KA88L (multiple Date Codes including 20170503) – 100% Failure Rate – High dissipation factor, Df.
Xilinx XC2V70-5FF1517C (multiple Date Codes including 1105, 1113, and 1117) – 7% Failure Rate – No output
PM A2SHB (Date Code not marked or labeled) - 9% Failure Rate – High Rds(on) and high Idss.
Yageo CC0805KKX5R8BB106 (Date Code 1741) – 26% Failure Rate – High capacitance.
Samsung CL05A105K05NNNC (Lot Code ADLFOGI/0223) – 20% Failure Rate – High capacitance.
Murata GCM31CC71H475KA03L (Date/Lot Code 20171122/WG7N15YF1 L073) – 100% Failure Rate – High dissipation factor, Df.
Xilinx XC7K420T-2FFG901I (multiple Date Codes including 1417) – 5% Failure Rate – Program errors and no output.
Xilinx XC7K325T-1FFG900C (multiple Date Codes also including 1417) - 10% Failure Rate – Program errors and no output.
Xilinx XC7K355T-2FFG901I (multiple Date Codes including 1525) – 46% Failure Rate – Program errors and no output.
Koa Speer SR732HTTER200F (Lot Code 70583293) – 100% Failure Rate – Low resistance.
Mitsubishi 2SC1946A (Lot Code 10AG) – 100% Failure Rate – Low BVebo, high Vbeo, low BVcbo, and FIN shorted to Base. Yikes!
Freescale MC68HC705J1ACDW (pictured, Date Code 234) – 33% Failure Rate – Blank and can be programmed. They should be locked.
TDK CGA5L1X7R1E106K160 (Date Code 1726) – 100% Failure Rate – Capacitance change exceeded specification at 125C. Not high temp range devices.
Fairchild FSB560A (Date Code 1747) – 100% Failure Rate – Low BVceo and Hfe.
Sipex SP3232EEN-L/TR (Date Codes 601 and 737) – 56% Failure Rate – Output switching does not work at low loads.
Realtek RTL8326-VC-LF (pictured, Date Code 525) – 33% Failure Rate – Broken protection diodes.
Cosel DBS400B07 (Date Code not marked or labeled) – 20% Failure Rate – No output.
TDK C3216X5R1C476M160AB (Lot Code S17H36577) – 100% Failure Rate – High capacitance change at 85C
Murata GRM155R70J105KA12D (Lot Code IA7801L83) – 54% Failure Rate – Low capacitance.
Sharp PC3H7AT00006 (Date Code 1726) – 29% Failure Rate – High Vf and short-circuit on input diode.
Taiyo Yuden UMK105CG4R7BVF (Date Code 1611) – 93% Failure Rate – High capacitance.
Renesas UPD78P0308GC-8EU-A (Date Code 748) - 5% Failure Rate – Blank-check error.
Altera EP3SE110F1152C2N (again, pictured, Date Code 1707) - 33% Failure Rate - Vcc shorted to GND.
National Semi LM2825-5 (Date Code R0330AP) – 80% Failure Rate – No output.
Samsung CL05A105K05NNNC-5 (Date Code 0551) – 100% Failure Rate – High capacitance (more than 10% higher than max tolerance).
Power Stor A1020-2R5105-R (Date Code not marked or labeled) – 47% Failure Rate – Low capacitance.
Vishay TNPV12061M80BEEN (Date Code 1731) – 100% Failure Rate – Resistance out of spec low and high.
Altera 5AGZME3E2H29I3LN (Date Code 1543) – 100% Failure Rate – Program error.
Xilinx XC7K325T-1FFG900C (multiple Date Codes including 1345) – 6% Failure Rate – Program error and no output.
Murata GRM21BR70J106KE76L (Date Code not marked or labeled) – 15% Failure Rate – High Df.
Altera EPM9320ARI208-19N (Date Code 823) – 9% Failure Rate – No output.
TDK C3216X5RC476M160AB (Lot Code S17H36577) – 100% Failure Rate – Low Df.
STMicroelectronics ESM6045DV (Date Code 504) – 100% Failure Rate – High Vf and high Icer.
Xilinx XC5VLX50-1FFG324I (Date Code 1637) – 14% Failure Rate – No output.
STMicroelectronics MC34063EBD-TR (Date Code 633) – 14% Failure Rate – No output and short-circuit.
STMicroelectronics STGP3HF60HD (Date Code 715) – 9% Failure Rate – High Iges.
Magnachip MDS5601URH (Lot Code HK6343 GG) – 100% Failure Rate – High Rds(on).
Micron PC28F640P30BF65A (Date Code 244) – 20% Failure Rate – Program error.
Taiyo Yuden UMK105CG4R7BVF (Lot Code 1611104242051J32016S) – 92.5% Failure Rate – High capacitance.
Sharp PC3H7AT00006 (Date Code 1726) – 29% Failure Rate – High Vf and input diode open-circuit.
Altera EP3SE110F1152C2N (pictured, Date Code 1707) – 33% Failure Rate – Vcc shorted to GND.
Renesas UPD78P0308GC-8EU-A (Date Code 748) – 5% Failure Rate – Blank-check error.
National Semiconductor LM2825-5 (Date Code 0330) – 80% Failure Rate – No output.
Magnachip MDS5601URH (Lot Code 1K73860 G, Date Code IK) – 100% Failure Rate – High Rds(on).
ON Semiconductor 1SMB5955BT3G (Lot Code J40) – 44% Failure Rate – High Vz.
Micron PC28F256P30TFE (Date Codes 543 and 553) - 100% Failure Rate – Program error.
NXP SCC2681AC1N40 (pictured, Date Code 1239) – 75% Failure Rate – Short pins and broken protection diodes.
Vishay SI4554DY-T1-GE3 (Date Code 1733) - 100% Failure Rate – High Rds(on).
International Rectifier IRG4PH50SPBF (Date Codes 608, 611, and 624) - 100% Failure Rate – Short-circuit.
Murata GCM32EC71H106KA01L (Lot Code not marked or labeled) - 50% Failure Rate – High Df.
Murata GCM188R71H224KA49D (Lot Code not marked or labeled) – 87% Failure Rate – High Df.
Murata GCM21BR71C475KA67L (Lot Code not marked or labeled) - 86% Failure Rate – Low capacitance.
Murata GCM188R11H104KA42D (Lot Code not marked or labeled) – 29% Failure Rate - Low capacitance.
Murata GCJ32ER71H475KA12L (Lot Code not marked or labeled) – 18% Failure Rate – Low capacitance.
Murata GCM188R71H224KA49D (Lot Code not marked or labeldd) - 60% Failure Rate – High Df.
ON Semiconductor 1SMB5955BT3G (Date Code 1740) - 28% Failure Rate – High Vz.
Cypress S29GL01GP13FFIV20 (Date Code 439) – 100% Failure Rate – Blank-check error.
Xilinx XC2VP70-5FFG1517C (multiple Date Codes including 1113) – 5% Failure Rate – Short pins.
Samsung CL21Y475KAFNNNE (Lot/Date Code AD7B0PQ/0224) – 6% Failure Rate – High capacitance.
 Xilinx XC7K325T-1FFG900C (Multiple Date Codes including 1441) – 24% Failure Rate – Program error.

ON Semiconductor NRVUA140VT3G (Date Code 1728) - 8% Failure Rate – High Vf.
STMicroelectronics BUX48A (Date Codes 0519 and 1523) – 100% Failure Rate – High Icer and high Ices.
STMicroelectonics STGF7H60D (Date Code 623) - 94% Failure Rate – Low Vge(th).
Intersil ICM7555MTV (Date Code H0042) – 32% Failure Rate – frequency out of spec, low and high.
Texas Instruments TMS320C30GEL50 (Lot Code ED-66ADE4T) – 100% Failure Rate – Broken protection diodes and shorted pins.
Xilinx XC7K480T-2FFG901I (Date Code 1701) – 31% Failure Rate – IO no output.
Vishay SFH6943A-3 (Date Code 1128) - 12% Failure Rate - High CTR, but one piece was even a low CTR.
AVX CB047G0104JBC (Lot Code 6X1A72105401) – 12% Failure Rate – High capacitance.
Intersil ICL7660SMTV (Date Code 1609) – 20% Failure Rate – Low output.
Tracpower TMR6-4823WI (Date Code 1737) - 99.7% Failure Rate - High +Vout and low -Vout.
AMD29F800BT-90EI (Date Code 803) – 100% Failure Rate – ID-check error.
Murata GCG188R91H104KA01D (Lot Code 5A-27930) – 38% Failure Rate - High Df and could not withstand rated insulation resistance.
Intersil ICM7555MTV (Date Code H0042) – 32% Failure Rate – frequency out of spec, low and high.
Altera EPM9320ARI208-10N (Date Code 823) – 9% Failure Rate - No output.
Freescale/Motorola MC68HC908AZ60CFU-2J74Y (Date Code 1222) – 58% Failure Rate – Program error. Pictured.
Xilinx XC7K325T-1FFG900C (Multiple Date Codes including 1417 and 1537) – 24% Failure Rate – Program error and no output.

 

2017 Substandard Parts list

Murata GRM21BR71A106KE51L (Lot code WG76205CC L035, Date code 20170627 (2617)) - 6% Failure Rate - high Capacitance.

Kemet C0603C472J1GACTU (Date Code 1727) - 100% Failure Rate - DF was more than 0.1%.

Nxp Semiconductor PMEG2005AEA (Date Code 1725)  - 100% Failure Rate - high Vf.

Murata GCM32EC71H106MA03L (Date Code 1646, Lot # IA6N06PLF L115) - 6% Failure Rate - High DF (dissipation factor).

Kemet T495D107K010ATA100 (Date Code 1708) - 13% Failure Rate - High and Low Capacitance and high ESR.

SEMIKRON SKM400GB12V (Date Code 0607)  - 100% Failure Rate - High Vce(sat) and Vf meaning they are not 90A devices.

Freescale Semiconductor DSP56301AG80 (Date Code 1337) - 12% Failure Rate - Incorrect pin-outs.

Xilinx Corporation XC2VP70-5FFG1517C (Date Code Multiple date code and no marking)- 13% Failure Rate – 34 piece failed with open pin, and 1 piece failed with no output.

Microsemi JAN2N4858 (Date Code no marked or labeled) -19% Failure Rate - 13 pieces failed with high Igss, 4 pieces failed with high Idss and 2 pieces failed with open-circuit.

Murata LQM31PN3R3M00L (Date Code no marked or labeled)  -15% Failure Rate - low DC Resistance.

Xilinx Corporation XC2S50-6PQG208C (Date Code 1621) -8.% Failure Rate - program error or no output(Some of failed parts are the dimension of part not match the socket ).

Kemet T494D107M016AT (Date Code no marked or labeled) -50% Failure Rate - high leakage current.

Freescale Semiconductor DSP56301AG100(Date Code 1308) -14% Failure Rate - open pin 28(BCLK).

Maxim Integrated DS1553-100 (Date Code 1607) -87.64% Failure Rate - Nonvolatile functionality.

Vishay 592D228X96R3X2T20H (Date Code no marked or labeled) -10% Failure Rate – low Capacitance.

Xilinx Corporation XC2S50-6PQG208C (Date Code 1621,1637) -5.51% Failure Rate - with program error or no output(Some of failed parts are the dimension of part not match the socket ).

GRM21BR71E335KA73L GRM21BR71E335KA73L (Date Code no markerd or labeled) -100% Failure Rate-Capacitance was more than 3.63uF.

Maxim Integrated DS1553-100 (Date Code 1403)- 54.17% Failure Rate - 4 pieces failed with program error,22 pieces failed with very the Nonvolatile functionality.
AVX 22201C106MAT2A (Date Code not marked or labeled)- 11.25% Failure Rate - with high Capacitance Change at 125°C.
Murata GRM31CC80J476ME18L (Date Code not marked or labeled) – 6.25% Failure Rate - low Capacitance.
Sharp LH28F320S5HNS-L90 (Date Code 0540) – 16.22% Failure Rate - with blank-check error(can not be erased) or poor contact pins.
ST Microelectronics STP5NK52ZD (Date Code not marked or labeled)- 21% Failure Rate - 10 pieces failed with high Rds(on), 9 pieces failed with high Idss and 2 pieces failed with short-circuit.
SEMIKRON SKM400GB12V (Date Code N/A)-100% Failure Rate - the Vce(sat) was more than 2.2V with 90A collector current and the Vf was more than 2.52V with 90A forward current.

Cypress Semiconductor  CY7C53120E4-40SXI  (Date Codes 1436)- 11% Failure Rate - failed with ID-check error. 
Micron Technology Inc  MT29F16G08ABABAWP-ITB (Date Codes 1405)  -100% Failure Rate- failed testing with ID-check error.
Panasonic ERJ-1TNF36R0U (Date Codes unknown)-23.75% Failure Ratefailed with high Resistance Temperature Coefficient at -55°C.
National Semiconductor LM112H/883B (Date Codes N/A)-18% Failure Rate- waveform distortion.
 Microchip Technology Inc  MRF49XA-I /ST (Date Code 1545) - 10% Failure Rate -whit broke protective diodes

Xilinx Corporation XC3S400A-4FTG256C (Date Codes 1701:;1705 )-6.03% Failure Rate- with program error or no output.

Nxp Semiconductor  BUK9875-100A  (Date Code not marked or labeled)-100% Failure Rate- with high Rds(on).

GPS  SL486DP  (Date Code not marked or labeled)-20% Failure Rate- with short pins and broken protective diodes.

Freescale Semiconductor DSP56301AG100  (Date Code 1308) - 14% Failure Rate - Open pin 28 (BCLK).

Maxim DS1267-100 (Date Code 1449,1443) – 100% Failure Rate - testing open/short, protective diodes and resistance of High.

Littelfuse 1.5SMC220CA  (Date Code N/A) - 71% Failure Rate - low Vbr (breakdown voltage).

Xilinx  XC2VP70-5FFG1517C  (Date Code unknown) - 45% Failure Rate – Program error or poor contact pin.

Realtek Semiconductor RTL8326-VC-LF (Date Code 8326) - 55% Failure Rate - broken protective diodes.

Xilinx Corporation  XQ4013E-4PG223M (Date Code 1201) – 20% Failure Rate - Can not load bitstream.

Analog Devices AD704ARZ-16 (Date Code 1614,1631)18.04% Failure Rate

Samsung  S3C2410A20-Y080 (Date Code 1328) - 6.0% Failure Rate - Short pins and broken protective diodes.

Siemens  TDA4718B (Date Codes 0821;0849) - 13.9% Failure Rate- with broken protective diodes.

Murata GCM188R71H103JA15D  (Date Code unknown) - 15% Failure Rate – with low Capacitance

AVX  TLJY687M006R0100 (Date Code N/A) - 17% Failure Rate -capacitance with readings lower than 544uF. 5 pieces failed DCL with leakage current within 45uA to 75uA

Maxim DS1267-100 (Date Code 1449;1443) - 100% Failure Rate-open-short, protective diodes and resistance of High

Motorola UAA1016B (Date Code 9352) - 100% Failure Rate -inconsistent pin-outs

Datel  TWR-5/1000-12/210-D24A-C(Date Code 9352)  - 100% Failure Rate -load current

Yageo  CC0805ZKY5V6BB106  (Date Code unknow) -15.63% Failure Rate -Insulation Resistance fail failed with breakdown.

Cypress Semiconductor  CY7B933-JC (Date Codes 1641) - 5.33Failure Rate - 4pcs (D/C-1641) open issues.

Kinston  KE4CN2H5A (Date Code 1424;1336) - 27% Failure Rate -can not beprogramm

TDK C2012C0G2W222KT000N(Date Code N/A) - 100Failure Rate -Found all failed that the Q was less than 1000.

Xilinx Corporation  XCS40XL-4PQ208I (Date Code 1533 - 5.13Failure Rate- failed with program error or no output.

Altera 5AGXMA5G4F31I5N (Date Code 1427) - 37.5% Failure Rate - Program error.

Texas instruments TLC2543IDBR (Date Code Unknown) - 10Failure Rate - digital code 0×477 at 2.5V analog input.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 7Failure Rate - 27 pieces failed wherein 11 pieces failed with high coil resistance, 3 pieces failed with open coil, 3 pieces failed with low coil resistance and 10 pieces failed with one or more non-switching contacts.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 7Failure Rate - 27 pieces failed wherein 11 pieces failed with high coil resistance, 3 pieces failed with open coil, 3 pieces failed with low coil resistance and 10 pieces failed with one or more non-switching contacts.

Xilinx Corporation XQ4013E-4PG223M (Date Code 1143) - 20Failure Rate - VCC and GND short circuit.

Nais DS4E-M-DC48V-1C-N76 (Date Code N/A) - 6Failure Rate - 11 pieces failed wherein 5 pieces failed with low coil resistance and 6 pieces failed with one or more pins contacting at open state.

Tyco TVB140NSA (Date Code N/A) - 100Failure Rate - Idm was more than 100uA while the Vdm was 15V. The Vdm was less than 15V.

Cypress CY27EE16ZEC-ES (Date Code 0309) - 5Failure Rate - 29 pieces failed with different EEPROM scratchpad addresses wherein 18 pieces cannot be programmed, 10 pieces with configurable clock outputs, and 1 piece with wrong frequency at start-up.

Xilinx Corporation XC7K480T-2FFG1156I (Date Code 1413) - 100% Failure Rate VCCIO, VCCINT and GND short circuit.

Xilinx Corporation XC2V1000-4FG456I  (Date Codes 1425 and 1419) - 5% Failure Rate - program error or no output.

Altera Corporation EPF10K100EQI208-2 (Date Code 1545) - 6Failure Rate - program error or no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) - 7Failure Rate - one or more non-switching contacts.

Altera Corporation EPF10K200SRC240-1X (Date Code 1149) - 5Failure Rate - no output.

Fairchild Semiconductor 740L6011 (Date Code not marked or labeled) - 17Failure Rate - no output switch.

Xilinx XC1701SO20I (Date Code unknown) – 100% Failure Rate - blanck-check error.

Omnivision Technologies, Inc OV9655-VL1A (Date Code unknown) – 16% Failure Rate - no image.

Fairchild Semiconductor MM74C923N (Date Code not marked or labeled) – 100% Failure Rate - wrong key-code.

Analog AD521SD/883B (Date Code not marked or labeled) – 8% Failure Rate - output distortion.

Analog Devices, Inc. AD5381BSTZ-5 (Date Code 1442) – 7% Failure Rate - wrong analog output at 38 and 39.

Xilinx Corporation XC3S1400A-4FTG256C (Date Code 1641) – 18% Failure Rate - program error or no output.

ST Microelectronics BTB16-800SWRG (Date Code not marked or labeled) – 100% Failure Rate - the Igt was more than 10mA.

Motorola MC68040RC25A (Date Code unknown) - 50% Failure Rate - open pins.

AMD AM29F800BT-70EI (Date Code 0525) - 100Failure Rate -  ID check error.

Xilinx Corporation XC2S200E-6PQG208I (Date Code 1423) 5Failure Rate -program error or no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) - 26Failure Rate - high coil resistance and one or more pins failing to make contact.

Xilinx Corporation XQ4013E-4PG223M (Date Code 1131) 16Failure Rate -no output.

Nais DS4E-M-DC48V-1C-N76 (Date Code not marked or labeled) 9Failure Rate -one or more non-switching contacts.

National Semiconductor LM108H (Date Code not marked or labeled) 21% Failure Rate - low output.

National Semiconductor LM108H (Date Code not marked or labeled) 10Failure Rate - low negative output.

 Renesas Electronics UPD70F3614M2GBA-GAH (Date Code not marked or labeled) - 84% Failure Rate - programmer communication error wherein the programmer cannot read the device ID.

Altera Corporation EP3C10F256CI7N (Date Codes 1609;1603;1609) – 9% Failure Rate- program error or no output.

Xilinx Corporation XQ4013E-4PG223M (Date Codes 1133 and 1143) - 53% Failure Rate - 不良品其无输出.

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) – 14% Failure Rate- 不良品其不良为无输出.

Xilinx Corporation XC7K325T-2FF676I (Multiple Date Code) – 12% Failure Rate- program error.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) – 28% Failure Rate - blank-check error(Can not be erased).

Xilinx Corporation XC3042-100PG84B (Date Code not marked or labeled) - 100Failure Rate - Pin F2 short-circuit to F9(F3 should short-circuit to F9 normally).

Texas instruments CC1020RSSR (Date Code unknown) – 100% Failure Rate - broken protective diodes.

Advanced Micro Devices AM29F032B-75/(90)EC/(D/I/F) (Date Code 9916) -28% Failure Rate - blank-check error(Can not be erased).

Skyworks AS179-92LF (Date Code not marked or labeled) - 13Failure Rate - 为开关无动作.

Texas instruments TMS320C25GBA (Date Code 1025) -76% Failure Rate - failed with open pins(L2).

Littelfuse 1.5SMC300A (Date Code not marked or labeled) - 19Failure Rate - high Ir.

ST Microelectronics L9162 (Date Code not marked or labeled) - 16%Failure Rate - no or wrong regulator outputs.

Freescale Semiconductor, Inc. MC68EC030FE40C (Date Code 0325) - 100%Failure Rate - short pins.

Philips BC879 (Date Code N/A) - 16Failure Rate - high Ices.

Vishay VQ1001P (Date Code N/A) - 63Failure Rate - low BVdss,high Rds(on),open-circuit and high leakage current.

Xilinx Corporation XC2C512-7FTG256C (Date Code 1541) - 6Failure Rate - broken protective diodes.

Analog Devices AD558SD (Date Codes 1611 and 1615) - 6Failure Rate - broken protective diodes.

Advanced Micro AM29DL323DB-90EI (Date Codes 0049,0044 and 0123) – 100% Failure Rate -  ID-check error.

Advanced Micro AM29F032B-90EC/(D) (Date Codes 0442 and 0535) – 10% Failure Rate - program error.

AMD AM29F800BT-70EC (Date Code 0525) - 100% Failure Rate - wrong ID code or poor contact pins.

Xilinx XC9536-10VQG44C (Date Code 1231) - 5Failure Rate -下载程序出错其版本为“0000”.

Altera EP20K1500EFC33-1X (Date Code 521) - 100Failure Rate - functional testing with no output.

Bourns SDR1305-101K (Date Code 1148) - 74Failure Rate - low Inductance(manufacturer specification is minimum of 90uH).

Freescale MC68HC705C8ACFNE (Date Code 1133) - 100% Failure Rate - blank-check error.

Microsemi APT66F60L (Date Code not marked or labeled) - 33% Failure Rate - short-circuits.

AVX  12065C224JAT2A (Date Code 1435 and 1502) - 37% Failure Rate - low capacitance.

Microsemi APT66F60L  (Date Code N/A) - 33% Failure Rate - short-circuits.

IXYS IXFK66N50Q2  (Date Code N/A) - 33% Failure Rate - short-circuits.

STMicroelectronics PSD854F2-90JI       (Date Code 723) - 100% Failure Rate - ID check error

Altera Corporation EP20K1500EFC33-1X     (Date Code 0521) - 50% Failure Rate - no output

Panasonic  ECK-TBC472MF   (Date Code N/A) - 42% Failure Rate - low Capacitance.

Atmel Corporation AT45DB642D-CNU        (Date Code 1324;1326;1306;1243) - 100% Failure Rate - 1024-Bytes Page size

NXP Semiconductors  74HC595D     (Date Code N/A) - 25% Failure Rate - the SHCP(pin11) short-circuit to GND

Mitsubishi  CM600DY-24A       (Date Code N/A) - 14% Failure Rate - low Vge(th).

Silicon Laboratories  CP2102-GM       (Date Code 1612) - 100% Failure Rate - 脚位保护二极管开路

Texas Instruments  TPS61040DBVR     (Date Code 1520;1523) - 50% Failure Rate - the used samples failed with low output that the internal switch didn’t work.

TDK  LTF5022T-100M1R3-D   (Date Code N/A) - 16% Failure Rate - 7 pieces failed with high Inductance and 1 piece failed with low Inductance.

Xilinx Corporation XC2S50-6TQG144C        (Date Code 1343) - 9% Failure Rate - program error or no output.

Murata  PRF18BE471QS5RB    (Date Code N/A) - 100% Failure Rate - the Resistance have no obvious change at 25°C, 80°C, 90°C, 93°C and 107°C.

EPCOS  B43693A2226Q007        (Date Code N/A) - 100% Failure Rate - high ESR and Impedance

Renesas Electronics  M3062LFGPFP#U3C      (Date Code N/A) - 60% Failure Rate - program error.

E-Switch  TL1015AF160QG   (Date Code N/A) - 50% Failure Rate - open contacts when the button is pressed

Xilinx Corporation  XC4VFX60-11FFG672C       (Date Code 1505) - 12% Failure Rate - program error.

Taiyo Yuden  UMK325C7106KM-T     (Date Code N/A) - 11% Failure Rate - 114 pieces failed with high DF, 3 pieces failed with low Capacitance and 1 piece failed with high Capacitance.

Xilinx Corporation  XC95288-15HQ208I    (Date Code 1017) - 50% Failure Rate - no output.

Xilinx Corporation  XQ4010E-4PG191M       (Date Code 1120) - 7% Failure Rate - no output.

Murata  HB01U05S05ZC     (Date Code N/A) - 100% Failure Rate - no output.

Microsemi  PIC601        (Date Code N/A) - 20% Failure Rate - 2 pieces failed with no output, 2 pieces failed with internal short-circuit and 2 pieces pins broken.

Xilinx Corporation  XC4VLX25-11FFG668I       (Date Code 1409) - 10% Failure Rate - no output.

Texas Instruments  TMS9995NL      (Date Code 9428) - 22% Failure Rate -  broken protective diodes

MIC  HER307     (Date Code N/A) - 6% Failure Rate - high Vf.

Sony  CXD1179Q        (Date Code Unknown) - 28% Failure Rate - open pins and broken protective diodes.

Xilinx Corporation  XC95288-15HQ208I      (Date Code 1017) - 10% Failure Rate - no output.

Texas Instruments  OPA2604AU     (Date Code N/A) - 66% Failure Rate -  low Vout.

Hittite  HMC234C8      (Date Code N/A) - 81% Failure Rate - no switching or distorted outputs.

Hittite  HMC403S8G     (Date Code N/A) - 84% Failure Rate - one output always high

Exar  XR68C681CP       (Date Code N/A) - 10% Failure Rate - short pins and broken protective diodes.

Texas instruments  TMS320F243PGEA     (Date Code N/A) - 6% Failure Rate - open and short pins.

MAXIM  MAX660ESA+      (Date Code N/A) - 6% Failure Rate - low Oscillator Frequency and 1 piece failed with -5.6V output.

MAXIM  MAX834EUK+T     (Date Code N/A) - 5% Failure Rate - 11 pieces failed that the Vout can’t be tripped, 10 pieces failed with no output and 1 piece failed that the Vout was tripped while the Vcc was 3.655V.

Omron  G3VM-41HR     (Date Code N/A) - 100% Failure Rate - the Ron was more than 20 with 2A load current at connection A.

Xilinx Corporation XC95288-15HQ208I    (Date Code 1013) - 100% Failure Rate - program error with Version”0000″

Gec Plessey SP8691A-DG     (Date Code N/A) - 100% Failure Rate - all parts failed at -55°C and 125°C with incorrect output frequency, wherein at cold temperature the output frequency is about 20MHz while at hot temperature it is about 16MHz with instability. At 25°C, all parts shows the correct output frequency.

ON Semiconductor MTP2P50E   (Date Code N/A) - 20% Failure Rate - high Idss

Analog Devices, Inc. AD8362ARUZ    (Date Code 1524) - 33% Failure Rate - 3 pieces with high gain (3.85V-4.86V), 4 pieces with no output, and 2 pieces with very low output (1V to 1.75V). 1 piece from unused samples failed with no output.

Analog Devices, Inc. AD5160BRJZ10    (Date Code N/A) - 100% Failure Rate - 3片为端点到端点的电阻大于500千欧,1片为70千欧,1片总是为5千欧其不能用不能用程序控制

Xilinx Corporation XC95288-15HQ208I    (Date Code 1027) - 100% Failure Rate - program error with Version”0000″

Xilinx Corporation XC4VSX35-10FFG668CS2   (Date Code 1409) - 25% Failure Rate - program error or no output.

Texas Instruments ADS7864Y250     (Date Code N/A) - 5% Failure Rate - readings of 0×800 at Full-scale (2.5V) or no data

ST Microelectronics PSD813F3-15J  (Date Code N/A) - 100% Failure Rate - ID error

Dallas Semiconductor DS1284QN   (Date Code 0818) - 100% Failure Rate - poor-contact-pin

Vishay  IRFP32N50KPBF    (Date Code N/A) - 22% Failure Rate - high Rds(on)

Xilinx Corporation XQ4005E-4PG156M    (Date Code 9817) - 100% Failure Rate - 都能装载bitstream配置芯片但是输出不正常

Xilinx Corporation XQ4010E-4PG191M      (Date Code 0541) - 100% Failure Rate - 1片不能装载比他stream配置芯片,1片为功能输出不良

Dallas Semiconductor DS1314S-2+  (Date Code N/A) - 25% Failure Rate - high /BW pin when Vbat is low and Vcc is above trip point.

Texas Instruments UCC2806DW   (Date Code N/A) - 36% Failure Rate - low Vref or no output switching

NXP Semiconductor  BTA316X-800B    (Date Code 1323; 1510;1408) - 51% Failure Rate - internal short-circuit

Xilinx Corporation XC9536-10VQG44C    (Date Code 1123) - 5% Failure Rate - program error or no output

Xilinx Corporation XC3SD3400A-4CSG484LI      (Date Code 1539;1541) - 10% Failure Rate - program  error  or no output

Maxim MAX8069CCZQ       (Date Code Unknown) - 99% Failure Rate - 78 pieces failed with Vf open and 21 pieces failed with high or low Vout.

Atmel Corporation AT45DB642D-CNU   (Date Code 1438) - 5% Failure Rate - program&verify error

PLX Technology, Inc. PCI9052G (Date Code Multiple date code) - 15% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q      (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 24% Failure Rate - program download error (53 pcs are ver.0) or no output

Samsung Electronics S3F441FXZZ-ETRF (Date Code 117) - 5% Failure Rate - open,short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C    (Date Code 1231) - 20% Failure Rate - program download error  or no output

Xilinx Corporation XC2V1000-5FG256I       (Date Code 1141;1109;1125) - 8% Failure Rate - program error or no output.

Zoran ZR36060PQCG29.5   (Date Code Unknown) - 24% Failure Rate - open or short pins

Princeton Technology Corp PT6520-Q (Date Code Unknown) - 23% Failure Rate - short pins and broken protective diodes.

Xilinx Corporation XC9536-10VQG44C      (Date Code 1123) - 5% Failure Rate - program error or no output.

Silicon Laboratories CP2102-GM    (Date Code 1546) - 33% Failure Rate - 脚位保护二极管开路.

Xilinx Corporation XC4VSX35-10FFG668CS2 (Date Code 1408) - 11% Failure Rate - no output.

Vishay JANTX2N6660    (Date Code N/A) - 6% Failure Rate - 2片漏电流偏高,22片内部开路,4片内部短路.

Silicon Laboratories CP2102-GM  (Date Code 1546) - 100% Failure Rate - 脚位保护二极管开路

Nais DS4-EM-DC48V-1C-N76    (Date Code N/A) - 9% Failure Rate - one or more contacts with high leakage

PANASONIC ECE-T1HA273FA    (Date Code 1408) - 11% Failure Rate - no output

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) – 26% Failure Rate - long duration or with wrong playback

Information Storage Devices, Inc. ISD2560P   (Date Code N/A) - 19% Failure Rate - short/long duration or with wrong playback

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Xilinx Corporation XC2V1000-5BG575I      (Date Code 1105;1233;1141) - 100% Failure Rate - wrong ID code.

Information Storage Devices, Inc. ISD2560P    (Date Code 1137) - 19% Failure Rate - short/long duration or with wrong playback.

Intel MG87C196KD-16  (Date Code 9736/9728) - 88% Failure Rate - There’s program exist in initial memory.

Renesas Electronics 2SJ222    (Date Code N/A) - 100% Failure Rate - the BVdss was less than -100V with -10mA drain current

Xilinx Corporation XC17128EPD8C    (Date Code N/A) - 20% Failure Rate - blank-check error.

Xilinx Corporation XQ4005E-4PG156M   (Date Code 1137) - 17% Failure Rate - programming error or no output.

Cypress Semiconductor CY7C344-25WM  (Date Code  N/A) - 100