PTPR & CVPD test Profile

Pin-to-Pin Resistance & Clampdown Voltage of Protection Diode Testing

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Pin-to-Pin Resistance and Clampdown Voltage of Protective Diode testing, or PTPR/CVPD, is a preferred testing option for high pin count and complex components where set-up for functional testing can be prohibitively long and expensive.

  • Fast Set-up & Programming Time
  • Fast Test Cycle Time
  • Low Price
  • High Degree of Reliability

 

It is highly recommended to include decapsulation analysis as added insurance against such situations. A golden sample is also preferred to compare measurements with a suspect device. Counterfeit ICs with the same die configuration with similar pin-outs but different functions can pass PTPR/CVPD testing and the decapsulation and golden sample comparison eliminate that possibility.

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Complete Testing Profile includes:

  • Pin-to-Pin Resistance Test
  • Clamp-down Voltage of Protective Diodes
  • Decapsulation Analysis (recommended)
  • Golden Sample Comparison (recommended)

White Horse’s test system for CVPD and PTPR testing facilitates pin counts up to 512, with high levels of precision in an automated test system (ATE) with 100% data storage and recall. Our application success rate with this testing is over 99% when combined with decapsulation analysis.

The #1 Cause of Component Failure is Opens and Shorts Caused by Overvoltage and Damaged Hardware. PTPR/CVPD Catches It.

Most semiconductors, particularly digital IC’s where inputs are exceptionally vulnerable to damage caused by overvoltage, have clamping diodes. Clamping diodes are used to protect the IC’s circuitry from electrostatic discharge (ESD), transients, voltage spikes and other causes of overvoltage. These diodes prevent damage to the IC by driving the unwanted current away from the main circuitry. We determine the part’s condition by testing its protection diodes.

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Clampdown Voltage Protection Diode (CVPD) testing includes:

  • Continuity (Pin Opens & Shorts)
  • Damaged Protection Diodes
  • Misalignment & Disoriented Dice/Lead Frame
  • Internal circuitry damage

Pin-to-Pin resistance (PTPR) testing supports the CVPD testing. Adjacent signal pins, including supply pins, should not be shorted with one another unless noted. All ground pins must be shorted unless the device specification notes a defined resistance between them. With these criteria, CVPD and PTPR will effectively detect a different die with different diode and ground pin placements than an authentic unit and identifies counterfeit ICs.

PTPR

 

Pin-to-Pin Resistance (PTPR) testing:

  • Adjacent pin shorts
  • Opens between ground pins
  • Resistance between two pins will be measured
  • Identifies the #1 Cause of Component Failure

 

 

Notes:  PTPR/CVPD test is not a parametric tor functional block test. If the parts fail, they will not work. If they pass, they are not assured to work in application so it is recommended to use this in conjunction with EVI and Decap, for example. It is the step between simple curve trace and functional or parametric testing on complex devices where set-up time and cost may be prohibitive, and this covered all of the pins whereas CT targets only a limited number of pins.

 PTPR/CVPD test Sample Report